Michael L. Rieger
About
Michael L. Rieger has authored 38 papers that have received a total of 199 indexed citations.
This includes 31 papers in Electrical and Electronic Engineering, 21 papers in Industrial and Manufacturing Engineering and 9 papers in Biomedical Engineering. The topics of these papers are Advancements in Photolithography Techniques (29 papers), Industrial Vision Systems and Defect Detection (17 papers) and Integrated Circuits and Semiconductor Failure Analysis (10 papers). Michael L. Rieger is often cited by papers focused on Advancements in Photolithography Techniques (29 papers), Industrial Vision Systems and Defect Detection (17 papers) and Integrated Circuits and Semiconductor Failure Analysis (10 papers) and collaborates with scholars based in United States, Germany and Switzerland. Michael L. Rieger's co-authors include Bernd Kuhlenkötter, Alexander Tritchkov, Kurt Ronse, Anthony Yen and Jason Huang and has published in prestigious journals such as ECS Transactions, Advanced materials research and Journal of Micro/Nanolithography MEMS and MOEMS.
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