M. Traving
Impact in
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- Copper Interconnects and Reliability
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- Semiconductor materials and devices
- Low-power high-performance VLSI design
Papers in
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- Semiconductor materials and devices 15
- Electronic Packaging and Soldering Technologies 6
- Chalcogenide Semiconductor Thin Films 4
- Integrated Circuits and Semiconductor Failure Analysis 3
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- Copper Interconnects and Reliability 15
- Co-authors
- G. Schindler (14 shared papers)M. Engelhardt (12 shared papers)G. Steinlesberger (10 shared papers)W. Steinhögl (11 shared papers)L. Kipp (7 shared papers)M. Skibowski (7 shared papers)E. E. Krasovskii (3 shared papers)W. Schattke (3 shared papers)
- Journals
- Microelectronic Engineering (5 papers)Applied Surface Science (3 papers)Physical review. B, Condensed matter (2 papers)Journal of Applied Physics (2 papers)Applied Physics Letters (1 paper)
- Partner nations
- GermanyAustriaUnited Kingdom
In The Last Decade
M. Traving
25 papers receiving 807 citations
Peers
Comparison fields: 5 of 47
- Electronic, Optical and Magnetic Materials 311
- Electrical and Electronic Engineering 636
- Materials Chemistry 390
- Atomic and Molecular Physics, and Optics 151
- Mechanics of Materials 73
Countries citing papers authored by M. Traving
This map shows the geographic impact of M. Traving's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Traving with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Traving more than expected).
Fields of papers citing papers by M. Traving
This network shows the impact of papers produced by M. Traving. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Traving. The network helps show where M. Traving may publish in the future.
Co-authors
The 25 scholars most cited alongside M. Traving, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 25 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2004 | 421 | |
| 2 | 1997 | 72 | |
| 3 | 2005 | 54 | |
| 4 | 2001 | 46 | |
| 5 | 2003 | 39 | |
| 6 | 2004 | 37 | |
| 7 | 2005 | 23 | |
| 8 | 1999 | 22 | |
| 9 | 2006 | 21 | |
| 10 | 2016 | 16 | |
| 11 | 2000 | 13 | |
| 12 | 2001 | 10 | |
| 13 | 2003 | 9 | |
| 14 | 1998 | 9 | |
| 15 | 2020 | 7 | |
| 16 | 2003 | 7 | |
| 17 | 2004 | 6 | |
| 18 | 2003 | 5 | |
| 19 | 2004 | 4 | |
| 20 | 2005 | 3 |
About M. Traving
M. Traving is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Materials Chemistry, Mechanics of Materials and Atomic and Molecular Physics, and Optics, having authored 25 papers that have together received 832 indexed citations. Recurring topics across this work include Copper Interconnects and Reliability (15 papers), Semiconductor materials and devices (15 papers), Electronic Packaging and Soldering Technologies (6 papers), 2D Materials and Applications (6 papers), Metal and Thin Film Mechanics (5 papers), Chalcogenide Semiconductor Thin Films (4 papers), Semiconductor materials and interfaces (4 papers) and Integrated Circuits and Semiconductor Failure Analysis (3 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (311 citations), Electrical and Electronic Engineering (636 citations), Materials Chemistry (390 citations), Atomic and Molecular Physics, and Optics (151 citations) and Mechanics of Materials (73 citations). M. Traving has collaborated with scholars based in Germany, Austria and United Kingdom. Frequent co-authors include G. Schindler, M. Engelhardt, G. Steinlesberger, W. Steinhögl, L. Kipp, M. Skibowski, E. E. Krasovskii, W. Schattke, F. Starrost and A. Ya. Perlov. Their work appears in journals such as Microelectronic Engineering, Applied Surface Science, Physical review. B, Condensed matter, Journal of Applied Physics and Applied Physics Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.