M. Peckerar
Impact in
- Radiation top 10%
- X-ray Spectroscopy and Fluorescence Analysis
-
- Electron and X-Ray Spectroscopy Techniques
Papers in
-
- Advancements in Semiconductor Devices and Circuit Design 8
- Semiconductor materials and devices 7
- CCD and CMOS Imaging Sensors 4
- Silicon Carbide Semiconductor Technologies 4
- 3D IC and TSV technologies 3
- Integrated Circuits and Semiconductor Failure Analysis 3
-
- Analog and Mixed-Signal Circuit Design 3
- Co-authors
- Neil Goldsman (8 shared papers)D. B. Brown (1 shared paper)John Gilfrich (1 shared paper)Akin Akturk (6 shared papers)David J. Nagel (1 shared paper)Balakumar Balachandran (1 shared paper)Wayne A. Churaman (1 shared paper)Miao Yu (1 shared paper)
- Journals
- Applied Physics Letters (3 papers)Microelectronic Engineering (2 papers)IEEE Transactions on Instrumentation and Measurement (2 papers)Journal of Applied Physics (2 papers)IEEE Transactions on Electron Devices (2 papers)
- Partner nations
- United States
In The Last Decade
M. Peckerar
27 papers receiving 302 citations
Peers
Comparison fields: 5 of 48
- Radiation 49
- Surfaces, Coatings and Films 33
- Electrical and Electronic Engineering 243
- Atomic and Molecular Physics, and Optics 74
- Instrumentation 8
Countries citing papers authored by M. Peckerar
This map shows the geographic impact of M. Peckerar's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Peckerar with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Peckerar more than expected).
Fields of papers citing papers by M. Peckerar
This network shows the impact of papers produced by M. Peckerar. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Peckerar. The network helps show where M. Peckerar may publish in the future.
Co-authors
The 25 scholars most cited alongside M. Peckerar, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 30 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2008 | 50 | |
| 2 | 1975 | 40 | |
| 3 | 2010 | 39 | |
| 4 | 1998 | 23 | |
| 5 | 1977 | 23 | |
| 6 | 2010 | 19 | |
| 7 | 2009 | 18 | |
| 8 | 1996 | 18 | |
| 9 | 2010 | 16 | |
| 10 | 1981 | 13 | |
| 11 | 2009 | 9 | |
| 12 | 1992 | 7 | |
| 13 | 1994 | 5 | |
| 14 | 1990 | 5 | |
| 15 | 1987 | 5 | |
| 16 | 2007 | 4 | |
| 17 | 2007 | 4 | |
| 18 | 1979 | 4 | |
| 19 | 2007 | 4 | |
| 20 | 2007 | 3 |
About M. Peckerar
M. Peckerar is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering, Surfaces, Coatings and Films, Atomic and Molecular Physics, and Optics and Instrumentation, having authored 30 papers that have together received 322 indexed citations. Recurring topics across this work include Advancements in Semiconductor Devices and Circuit Design (8 papers), Semiconductor materials and devices (7 papers), Electron and X-Ray Spectroscopy Techniques (5 papers), CCD and CMOS Imaging Sensors (4 papers), Silicon Carbide Semiconductor Technologies (4 papers), Analog and Mixed-Signal Circuit Design (3 papers), 3D IC and TSV technologies (3 papers) and Integrated Circuits and Semiconductor Failure Analysis (3 papers). The work is most often cited by research in Radiation (49 citations), Surfaces, Coatings and Films (33 citations), Electrical and Electronic Engineering (243 citations), Atomic and Molecular Physics, and Optics (74 citations) and Instrumentation (8 citations). M. Peckerar has collaborated with scholars based in United States. Frequent co-authors include Neil Goldsman, D. B. Brown, John Gilfrich, Akin Akturk, David J. Nagel, Balakumar Balachandran, Wayne A. Churaman, Miao Yu, Siddharth Potbhare and Luke J. Currano. Their work appears in journals such as Applied Physics Letters, Microelectronic Engineering, IEEE Transactions on Instrumentation and Measurement, Journal of Applied Physics and IEEE Transactions on Electron Devices.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.