M. Peckerar
Impact in
- Radiation top 10%
- X-ray Spectroscopy and Fluorescence Analysis
-
- Electron and X-Ray Spectroscopy Techniques
Papers in
-
- Advancements in Semiconductor Devices and Circuit Design 8
- Semiconductor materials and devices 7
- Silicon Carbide Semiconductor Technologies 4
- CCD and CMOS Imaging Sensors 4
- Integrated Circuits and Semiconductor Failure Analysis 3
- 3D IC and TSV technologies 3
- Co-authors
- Neil Goldsman (8 shared papers)John Gilfrich (1 shared paper)D. B. Brown (1 shared paper)Akin Akturk (6 shared papers)David J. Nagel (1 shared paper)Seokjin Kim (2 shared papers)Miao Yu (1 shared paper)Wayne A. Churaman (1 shared paper)
- Journals
- Applied Physics Letters (3 papers)Journal of Applied Physics (2 papers)IEEE Transactions on Instrumentation and Measurement (2 papers)Microelectronic Engineering (2 papers)IEEE Transactions on Electron Devices (2 papers)
- Partner nations
- United States
In The Last Decade
M. Peckerar
29 papers receiving 328 citations
Peers
Comparison fields: 5 of 53
- Radiation 58
- Surfaces, Coatings and Films 35
- Electrical and Electronic Engineering 259
- Structural Biology 5
- Atomic and Molecular Physics, and Optics 78
Countries citing papers authored by M. Peckerar
This map shows the geographic impact of M. Peckerar's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Peckerar with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Peckerar more than expected).
Fields of papers citing papers by M. Peckerar
This network shows the impact of papers produced by M. Peckerar. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Peckerar. The network helps show where M. Peckerar may publish in the future.
Co-authors
The 25 scholars most cited alongside M. Peckerar, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 31 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2008 | 53 | |
| 2 | 1975 | 46 | |
| 3 | 2010 | 41 | |
| 4 | 1977 | 26 | |
| 5 | 1998 | 25 | |
| 6 | 2009 | 21 | |
| 7 | 1996 | 19 | |
| 8 | 2010 | 19 | |
| 9 | 2010 | 18 | |
| 10 | 1981 | 15 | |
| 11 | 1992 | 9 | |
| 12 | 2009 | 9 | |
| 13 | 1990 | 7 | |
| 14 | 1994 | 5 | |
| 15 | 1987 | 5 | |
| 16 | 1979 | 5 | |
| 17 | 2007 | 4 | |
| 18 | 2007 | 4 | |
| 19 | 2007 | 4 | |
| 20 | 2007 | 3 |
About M. Peckerar
M. Peckerar is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering, Surfaces, Coatings and Films, Atomic and Molecular Physics, and Optics and Hardware and Architecture, having authored 31 papers that have together received 354 indexed citations. Recurring topics across this work include Advancements in Semiconductor Devices and Circuit Design (8 papers), Semiconductor materials and devices (7 papers), Electron and X-Ray Spectroscopy Techniques (5 papers), Silicon Carbide Semiconductor Technologies (4 papers), CCD and CMOS Imaging Sensors (4 papers), Integrated Circuits and Semiconductor Failure Analysis (3 papers), VLSI and Analog Circuit Testing (3 papers) and 3D IC and TSV technologies (3 papers). The work is most often cited by research in Radiation (58 citations), Surfaces, Coatings and Films (35 citations), Electrical and Electronic Engineering (259 citations), Structural Biology (5 citations) and Atomic and Molecular Physics, and Optics (78 citations). M. Peckerar has collaborated with scholars based in United States. Frequent co-authors include Neil Goldsman, John Gilfrich, D. B. Brown, Akin Akturk, David J. Nagel, Seokjin Kim, Miao Yu, Wayne A. Churaman, Siddharth Potbhare and Luke J. Currano. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics, IEEE Transactions on Instrumentation and Measurement, Microelectronic Engineering and IEEE Transactions on Electron Devices.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.