John Gilfrich
Impact in
- Radiation top 1%
- X-ray Spectroscopy and Fluorescence Analysis
- Nuclear Physics and Applications
- Advanced X-ray Imaging Techniques
- Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques
Papers in
- Radiation 47
- X-ray Spectroscopy and Fluorescence Analysis 43
- Nuclear Physics and Applications 15
- Advanced X-ray Imaging Techniques 11
-
- X-ray Diffraction in Crystallography 22
- Co-authors
- William J. Buehler (1 shared paper)Ralph Wiley (1 shared paper)L. S. Birks (12 shared papers)D. B. Brown (9 shared papers)P. G. Burkhalter (8 shared papers)David J. Nagel (14 shared papers)J. W. Criss (1 shared paper)W. M. Hubbard (3 shared papers)
- Journals
- Analytical Chemistry (9 papers)Applied Spectroscopy (4 papers)Journal of Applied Physics (4 papers)X-Ray Spectrometry (11 papers)Spectrochimica Acta Part B Atomic Spectroscopy (1 paper)
- Partner nations
- United States
In The Last Decade
John Gilfrich
71 papers receiving 1.6k citations
John Gilfrich's Hit Papers
Peers
Comparison fields: 5 of 121
- Radiation 611
- Surfaces, Coatings and Films 194
- Materials Chemistry 990
- Electronic, Optical and Magnetic Materials 174
- Orthodontics 35
Countries citing papers authored by John Gilfrich
This map shows the geographic impact of John Gilfrich's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by John Gilfrich with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites John Gilfrich more than expected).
Fields of papers citing papers by John Gilfrich
This network shows the impact of papers produced by John Gilfrich. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by John Gilfrich. The network helps show where John Gilfrich may publish in the future.
Co-authors
The 25 scholars most cited alongside John Gilfrich, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 75 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | Effect of Low-Temperature Phase Changes on the Mechanical Properties of Alloys near Composition TiNi Hit paper breakdown → | 1963 | 890 |
| 2 | 1968 | 125 | |
| 3 | 1978 | 111 | |
| 4 | 1983 | 57 | |
| 5 | 1973 | 57 | |
| 6 | 1960 | 54 | |
| 7 | 1975 | 46 | |
| 8 | 1975 | 43 | |
| 9 | 1971 | 32 | |
| 10 | 1978 | 31 | |
| 11 | 1982 | 29 | |
| 12 | 1984 | 28 | |
| 13 | 1971 | 28 | |
| 14 | 1982 | 27 | |
| 15 | 1991 | 24 | |
| 16 | 1967 | 24 | |
| 17 | 1969 | 23 | |
| 18 | 1982 | 22 | |
| 19 | 1970 | 19 | |
| 20 | 1966 | 15 |
About John Gilfrich
John Gilfrich is a scholar working on Radiation, Materials Chemistry, Biomedical Engineering, Condensed Matter Physics and Surfaces, Coatings and Films, having authored 75 papers that have together received 1.9k indexed citations. Recurring topics across this work include X-ray Spectroscopy and Fluorescence Analysis (43 papers), X-ray Diffraction in Crystallography (22 papers), Nuclear Physics and Applications (15 papers), Advanced X-ray Imaging Techniques (11 papers), Advanced X-ray and CT Imaging (8 papers), Electron and X-Ray Spectroscopy Techniques (8 papers), Crystallography and Radiation Phenomena (7 papers) and Metal and Thin Film Mechanics (5 papers). The work is most often cited by research in Radiation (611 citations), Surfaces, Coatings and Films (194 citations), Materials Chemistry (990 citations), Electronic, Optical and Magnetic Materials (174 citations) and Orthodontics (35 citations). John Gilfrich has collaborated with scholars based in United States. Frequent co-authors include William J. Buehler, Ralph Wiley, L. S. Birks, D. B. Brown, P. G. Burkhalter, David J. Nagel, J. W. Criss, W. M. Hubbard, Troy W. Barbee and S. B. Qadri. Their work appears in journals such as Analytical Chemistry, Applied Spectroscopy, Journal of Applied Physics, X-Ray Spectrometry and Spectrochimica Acta Part B Atomic Spectroscopy.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.