John Gilfrich
Impact in
- Radiation top 1%
- X-ray Spectroscopy and Fluorescence Analysis
- Nuclear Physics and Applications
- Advanced X-ray Imaging Techniques
- Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques
Papers in
- Radiation 40
- X-ray Spectroscopy and Fluorescence Analysis 37
- Nuclear Physics and Applications 14
- Advanced X-ray Imaging Techniques 9
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- X-ray Diffraction in Crystallography 16
- Co-authors
- William J. Buehler (1 shared paper)Ralph Wiley (1 shared paper)L. S. Birks (11 shared papers)D. B. Brown (9 shared papers)P. G. Burkhalter (8 shared papers)David J. Nagel (9 shared papers)J. W. Criss (1 shared paper)W. M. Hubbard (3 shared papers)
- Journals
- Analytical Chemistry (8 papers)Journal of Applied Physics (4 papers)Applied Spectroscopy (4 papers)X-Ray Spectrometry (11 papers)Analytica Chimica Acta (1 paper)
- Partner nations
- United States
In The Last Decade
John Gilfrich
58 papers receiving 1.4k citations
John Gilfrich's Hit Papers
Peers
Comparison fields: 5 of 116
- Radiation 521
- Surfaces, Coatings and Films 164
- Materials Chemistry 858
- Electronic, Optical and Magnetic Materials 155
- Orthodontics 36
Countries citing papers authored by John Gilfrich
This map shows the geographic impact of John Gilfrich's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by John Gilfrich with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites John Gilfrich more than expected).
Fields of papers citing papers by John Gilfrich
This network shows the impact of papers produced by John Gilfrich. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by John Gilfrich. The network helps show where John Gilfrich may publish in the future.
Co-authors
The 25 scholars most cited alongside John Gilfrich, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 60 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | Effect of Low-Temperature Phase Changes on the Mechanical Properties of Alloys near Composition TiNi Hit paper breakdown → | 1963 | 783 |
| 2 | 1968 | 109 | |
| 3 | 1978 | 93 | |
| 4 | 1973 | 49 | |
| 5 | 1983 | 47 | |
| 6 | 1960 | 42 | |
| 7 | 1975 | 40 | |
| 8 | 1975 | 40 | |
| 9 | 1984 | 28 | |
| 10 | 1971 | 28 | |
| 11 | 1978 | 28 | |
| 12 | 1982 | 25 | |
| 13 | 1971 | 25 | |
| 14 | 1967 | 23 | |
| 15 | 1991 | 22 | |
| 16 | 1982 | 21 | |
| 17 | 1982 | 20 | |
| 18 | 1969 | 19 | |
| 19 | 1970 | 13 | |
| 20 | 1966 | 13 |
About John Gilfrich
John Gilfrich is a scholar working on Radiation, Materials Chemistry, Condensed Matter Physics, Surfaces, Coatings and Films and Biomedical Engineering, having authored 60 papers that have together received 1.6k indexed citations. Recurring topics across this work include X-ray Spectroscopy and Fluorescence Analysis (37 papers), X-ray Diffraction in Crystallography (16 papers), Nuclear Physics and Applications (14 papers), Advanced X-ray Imaging Techniques (9 papers), Electron and X-Ray Spectroscopy Techniques (7 papers), Crystallography and Radiation Phenomena (7 papers), Advanced X-ray and CT Imaging (5 papers) and Metal and Thin Film Mechanics (4 papers). The work is most often cited by research in Radiation (521 citations), Surfaces, Coatings and Films (164 citations), Materials Chemistry (858 citations), Electronic, Optical and Magnetic Materials (155 citations) and Orthodontics (36 citations). John Gilfrich has collaborated with scholars based in United States. Frequent co-authors include William J. Buehler, Ralph Wiley, L. S. Birks, D. B. Brown, P. G. Burkhalter, David J. Nagel, J. W. Criss, W. M. Hubbard, Troy W. Barbee and S. B. Qadri. Their work appears in journals such as Analytical Chemistry, Journal of Applied Physics, Applied Spectroscopy, X-Ray Spectrometry and Analytica Chimica Acta.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.