M. Liehr
Impact in
- Surfaces, Coatings and Films top 1%
- Electron and X-Ray Spectroscopy Techniques
-
- Semiconductor materials and devices
- Integrated Circuits and Semiconductor Failure Analysis
- Silicon and Solar Cell Technologies
Papers in
-
- Semiconductor materials and devices 60
- Silicon and Solar Cell Technologies 19
- Integrated Circuits and Semiconductor Failure Analysis 11
- Thin-Film Transistor Technologies 10
-
- Semiconductor materials and interfaces 19
- Co-authors
- R. Caudano (25 shared papers)P.A. Thiry (16 shared papers)S. R. Kasi (11 shared papers)Gary W. Rubloff (14 shared papers)John E. Lewis (4 shared papers)J.P. Delrue (6 shared papers)Jean‐Jacques Pireaux (5 shared papers)M. Offenberg (8 shared papers)
- Journals
- Journal of Vacuum Science & Technology A Vacuum Surfaces and Films (20 papers)Applied Physics Letters (13 papers)Physical review. B, Condensed matter (6 papers)Surface Science (5 papers)Diamond and Related Materials (4 papers)
- Partner nations
- United StatesBelgiumGermany
In The Last Decade
M. Liehr
113 papers receiving 3.2k citations
Peers
Comparison fields: 5 of 77
- Surfaces, Coatings and Films 542
- Electrical and Electronic Engineering 2.1k
- Atomic and Molecular Physics, and Optics 1.1k
- Materials Chemistry 1.5k
- Structural Biology 43
Countries citing papers authored by M. Liehr
This map shows the geographic impact of M. Liehr's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Liehr with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Liehr more than expected).
Fields of papers citing papers by M. Liehr
This network shows the impact of papers produced by M. Liehr. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Liehr. The network helps show where M. Liehr may publish in the future.
Co-authors
The 25 scholars most cited alongside M. Liehr, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 115 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 1984 | 174 | |
| 2 | 2016 | 173 | |
| 3 | 1984 | 156 | |
| 4 | 1987 | 143 | |
| 5 | 1985 | 120 | |
| 6 | 1990 | 108 | |
| 7 | 1984 | 105 | |
| 8 | 1992 | 97 | |
| 9 | 1986 | 90 | |
| 10 | 1990 | 87 | |
| 11 | 1986 | 76 | |
| 12 | 1990 | 74 | |
| 13 | 1984 | 72 | |
| 14 | 1984 | 70 | |
| 15 | 1987 | 69 | |
| 16 | 1977 | 61 | |
| 17 | 1991 | 60 | |
| 18 | 2010 | 59 | |
| 19 | 1987 | 59 | |
| 20 | 1988 | 56 |
About M. Liehr
M. Liehr is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Materials Chemistry, Surfaces, Coatings and Films and Electronic, Optical and Magnetic Materials, having authored 115 papers that have together received 3.3k indexed citations. Recurring topics across this work include Semiconductor materials and devices (60 papers), Electron and X-Ray Spectroscopy Techniques (26 papers), Semiconductor materials and interfaces (19 papers), Silicon and Solar Cell Technologies (19 papers), Integrated Circuits and Semiconductor Failure Analysis (11 papers), Copper Interconnects and Reliability (11 papers), Diamond and Carbon-based Materials Research (10 papers) and Thin-Film Transistor Technologies (10 papers). The work is most often cited by research in Surfaces, Coatings and Films (542 citations), Electrical and Electronic Engineering (2.1k citations), Atomic and Molecular Physics, and Optics (1.1k citations), Materials Chemistry (1.5k citations) and Structural Biology (43 citations). M. Liehr has collaborated with scholars based in United States, Belgium and Germany. Frequent co-authors include R. Caudano, P.A. Thiry, S. R. Kasi, Gary W. Rubloff, John E. Lewis, J.P. Delrue, Jean‐Jacques Pireaux, M. Offenberg, J. J. Pireaux and F. K. LeGoues. Their work appears in journals such as Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, Applied Physics Letters, Physical review. B, Condensed matter, Surface Science and Diamond and Related Materials.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.