M. Laudon
Impact in
-
- Advanced MEMS and NEMS Technologies
- Advancements in Photolithography Techniques
- Photonic and Optical Devices
-
- Advanced Surface Polishing Techniques
- Nanofabrication and Lithography Techniques
Papers in
-
- Advancements in Photolithography Techniques 9
- Silicon and Solar Cell Technologies 3
- Advanced MEMS and NEMS Technologies 2
-
- Welding Techniques and Residual Stresses 2
- Co-authors
- Philippe Renaud (3 shared papers)H. Lorenz (1 shared paper)Edward G. Lovell (2 shared papers)J. Klein (1 shared paper)Todd R. Christenson (1 shared paper)H. Guckel (1 shared paper)K.J. Skrobis (1 shared paper)Neil Carlson (3 shared papers)
- Journals
- Microelectronic Engineering (4 papers)Applied Physics Letters (1 paper)Japanese Journal of Applied Physics (1 paper)Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena (4 papers)TechConnect Briefs (1 paper)
- Partner nations
- United StatesSwitzerlandFrance
In The Last Decade
M. Laudon
15 papers receiving 344 citations
Peers
Comparison fields: 5 of 37
- Electrical and Electronic Engineering 281
- Biomedical Engineering 175
- Atomic and Molecular Physics, and Optics 121
- Surfaces, Coatings and Films 21
- Mechanics of Materials 65
Countries citing papers authored by M. Laudon
This map shows the geographic impact of M. Laudon's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Laudon with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Laudon more than expected).
Fields of papers citing papers by M. Laudon
This network shows the impact of papers produced by M. Laudon. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Laudon. The network helps show where M. Laudon may publish in the future.
Co-authors
The 20 scholars most cited alongside M. Laudon, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1998 | 150 | |
| 2 | 2003 | 137 | |
| 3 | 2001 | 25 | |
| 4 | 1996 | 9 | |
| 5 | 1997 | 8 | |
| 6 | 1993 | 7 | |
| 7 | 1996 | 7 | |
| 8 | 1995 | 4 | |
| 9 | 2001 | 4 | |
| 10 | 1997 | 3 | |
| 11 | 1993 | 3 | |
| 12 | 1998 | 2 | |
| 13 | System-Level Simulation Using Mixed-Nature Models | 1996 | 2 |
| 14 | Multiscale Modeling of Stress-Mediated Diffusion in Silicon, Ab Initio to Continuum | 2000 | 1 |
| 15 | 1997 | 1 |
About M. Laudon
M. Laudon is a scholar working on Electrical and Electronic Engineering, Mechanical Engineering, Biomedical Engineering, Materials Chemistry and Surfaces, Coatings and Films, having authored 15 papers that have together received 363 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (9 papers), Advanced Surface Polishing Techniques (5 papers), Silicon and Solar Cell Technologies (3 papers), Microstructure and mechanical properties (3 papers), Welding Techniques and Residual Stresses (2 papers), Electron and X-Ray Spectroscopy Techniques (2 papers), Advanced MEMS and NEMS Technologies (2 papers) and Copper Interconnects and Reliability (2 papers). The work is most often cited by research in Electrical and Electronic Engineering (281 citations), Biomedical Engineering (175 citations), Atomic and Molecular Physics, and Optics (121 citations), Surfaces, Coatings and Films (21 citations) and Mechanics of Materials (65 citations). M. Laudon has collaborated with scholars based in United States, Switzerland and France. Frequent co-authors include Philippe Renaud, H. Lorenz, Edward G. Lovell, J. Klein, Todd R. Christenson, H. Guckel, K.J. Skrobis, Neil Carlson, Wolfgang Windl and Murray S. Daw. Their work appears in journals such as Microelectronic Engineering, Applied Physics Letters, Japanese Journal of Applied Physics, Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena and TechConnect Briefs.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.