M. Gall
Impact in
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- Copper Interconnects and Reliability
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- Semiconductor materials and devices
- Electronic Packaging and Soldering Technologies
- Integrated Circuits and Semiconductor Failure Analysis
- Advancements in Semiconductor Devices and Circuit Design
- 3D IC and TSV technologies
Papers in
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- Electronic Packaging and Soldering Technologies 26
- Semiconductor materials and devices 25
- Integrated Circuits and Semiconductor Failure Analysis 8
- Advancements in Semiconductor Devices and Circuit Design 5
- 3D IC and TSV technologies 5
- Radio Frequency Integrated Circuit Design 3
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- Copper Interconnects and Reliability 31
- Co-authors
- H. Kawasaki (15 shared papers)Paul S. Ho (14 shared papers)Meike Hauschildt (14 shared papers)D. Jawarani (13 shared papers)C. Capasso (12 shared papers)Ehrenfried Zschech (11 shared papers)Patrick Justison (7 shared papers)Ch. S. N. Murthy (1 shared paper)
- Journals
- Applied Physics Letters (4 papers)Journal of Applied Physics (3 papers)IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (2 papers)IEEE Transactions on Device and Materials Reliability (1 paper)Thin Solid Films (1 paper)
- Partner nations
- United StatesGermanyFrance
In The Last Decade
M. Gall
39 papers receiving 322 citations
Peers
Comparison fields: 5 of 33
- Electronic, Optical and Magnetic Materials 237
- Electrical and Electronic Engineering 325
- Hardware and Architecture 21
- Mechanics of Materials 32
- Atomic and Molecular Physics, and Optics 30
Countries citing papers authored by M. Gall
This map shows the geographic impact of M. Gall's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Gall with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Gall more than expected).
Fields of papers citing papers by M. Gall
This network shows the impact of papers produced by M. Gall. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Gall. The network helps show where M. Gall may publish in the future.
Co-authors
The 25 scholars most cited alongside M. Gall, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 43 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2001 | 48 | |
| 2 | 2013 | 48 | |
| 3 | 2007 | 35 | |
| 4 | 1997 | 18 | |
| 5 | 2004 | 17 | |
| 6 | 2006 | 15 | |
| 7 | 2000 | 15 | |
| 8 | 2018 | 13 | |
| 9 | 2006 | 12 | |
| 10 | 1998 | 11 | |
| 11 | 2021 | 11 | |
| 12 | 2004 | 8 | |
| 13 | 1999 | 7 | |
| 14 | 2014 | 6 | |
| 15 | 2018 | 6 | |
| 16 | 1998 | 6 | |
| 17 | 2002 | 6 | |
| 18 | 2008 | 5 | |
| 19 | 2011 | 5 | |
| 20 | 1998 | 5 |
About M. Gall
M. Gall is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Mechanics of Materials, Materials Chemistry and Biomedical Engineering, having authored 43 papers that have together received 349 indexed citations. Recurring topics across this work include Copper Interconnects and Reliability (31 papers), Electronic Packaging and Soldering Technologies (26 papers), Semiconductor materials and devices (25 papers), Integrated Circuits and Semiconductor Failure Analysis (8 papers), Advancements in Semiconductor Devices and Circuit Design (5 papers), 3D IC and TSV technologies (5 papers), Metal and Thin Film Mechanics (3 papers) and Radio Frequency Integrated Circuit Design (3 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (237 citations), Electrical and Electronic Engineering (325 citations), Hardware and Architecture (21 citations), Mechanics of Materials (32 citations) and Atomic and Molecular Physics, and Optics (30 citations). M. Gall has collaborated with scholars based in United States, Germany and France. Frequent co-authors include H. Kawasaki, Paul S. Ho, Meike Hauschildt, D. Jawarani, C. Capasso, Ehrenfried Zschech, Patrick Justison, Ch. S. N. Murthy, Oliver Aubel and G. Talut. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on Device and Materials Reliability and Thin Solid Films.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.