M. Gall
Impact in
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- Copper Interconnects and Reliability
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- Semiconductor materials and devices
- Electronic Packaging and Soldering Technologies
- Integrated Circuits and Semiconductor Failure Analysis
- Advancements in Semiconductor Devices and Circuit Design
- 3D IC and TSV technologies
Papers in
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- Copper Interconnects and Reliability 31
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- Electronic Packaging and Soldering Technologies 26
- Semiconductor materials and devices 25
- Integrated Circuits and Semiconductor Failure Analysis 8
- 3D IC and TSV technologies 5
- Advancements in Semiconductor Devices and Circuit Design 5
- Co-authors
- Hisao Kawasaki (15 shared papers)Paul S. Ho (14 shared papers)Meike Hauschildt (14 shared papers)Dharmesh Jawarani (13 shared papers)Cristiano Capasso (12 shared papers)Ehrenfried Zschech (11 shared papers)Patrick R. Justison (7 shared papers)Ch. S. N. Murthy (1 shared paper)
- Journals
- Applied Physics Letters (4 papers)Journal of Applied Physics (3 papers)IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (2 papers)Microelectronics Reliability (1 paper)Journal of Power Sources (1 paper)
- Partner nations
- United StatesGermanyFrance
In The Last Decade
M. Gall
38 papers receiving 329 citations
Peers
Comparison fields: 5 of 33
- Electronic, Optical and Magnetic Materials 242
- Electrical and Electronic Engineering 327
- Hardware and Architecture 20
- Mechanics of Materials 32
- Atomic and Molecular Physics, and Optics 31
Countries citing papers authored by M. Gall
This map shows the geographic impact of M. Gall's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Gall with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Gall more than expected).
Fields of papers citing papers by M. Gall
This network shows the impact of papers produced by M. Gall. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Gall. The network helps show where M. Gall may publish in the future.
Co-authors
The 25 scholars most cited alongside M. Gall, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 43 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2001 | 49 | |
| 2 | 2013 | 49 | |
| 3 | 2007 | 35 | |
| 4 | 2004 | 17 | |
| 5 | 1997 | 17 | |
| 6 | 2006 | 15 | |
| 7 | 2000 | 15 | |
| 8 | 2006 | 13 | |
| 9 | 2018 | 13 | |
| 10 | 2021 | 11 | |
| 11 | 1998 | 11 | |
| 12 | 2004 | 9 | |
| 13 | 2014 | 7 | |
| 14 | 1998 | 6 | |
| 15 | 1999 | 6 | |
| 16 | 2002 | 6 | |
| 17 | 2018 | 6 | |
| 18 | 1998 | 5 | |
| 19 | 2023 | 5 | |
| 20 | 2011 | 5 |
About M. Gall
M. Gall is a scholar working on Electronic, Optical and Magnetic Materials, Electrical and Electronic Engineering, Mechanics of Materials, Surfaces, Coatings and Films and Materials Chemistry, having authored 43 papers that have together received 355 indexed citations. Recurring topics across this work include Copper Interconnects and Reliability (31 papers), Electronic Packaging and Soldering Technologies (26 papers), Semiconductor materials and devices (25 papers), Integrated Circuits and Semiconductor Failure Analysis (8 papers), 3D IC and TSV technologies (5 papers), Advancements in Semiconductor Devices and Circuit Design (5 papers), Metal and Thin Film Mechanics (3 papers) and Corrosion Behavior and Inhibition (3 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (242 citations), Electrical and Electronic Engineering (327 citations), Hardware and Architecture (20 citations), Mechanics of Materials (32 citations) and Atomic and Molecular Physics, and Optics (31 citations). M. Gall has collaborated with scholars based in United States, Germany and France. Frequent co-authors include Hisao Kawasaki, Paul S. Ho, Meike Hauschildt, Dharmesh Jawarani, Cristiano Capasso, Ehrenfried Zschech, Patrick R. Justison, Ch. S. N. Murthy, Christian Hennesthal and Oliver Aubel. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Microelectronics Reliability and Journal of Power Sources.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.