L. Grella
Impact in
- Structural Biology top 5%
- Advanced Electron Microscopy Techniques and Applications
- Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques
Papers in
-
- Advancements in Photolithography Techniques 45
- Integrated Circuits and Semiconductor Failure Analysis 11
- Semiconductor materials and devices 4
-
- Electron and X-Ray Spectroscopy Techniques 29
- Optical Coatings and Gratings 10
- Co-authors
- M. Gentili (33 shared papers)M. Baciocchi (24 shared papers)Enzo Di Fabrizio (20 shared papers)Gian F. Lorusso (7 shared papers)W. Yun (4 shared papers)Barry Lai (4 shared papers)F. Cerrina (5 shared papers)David Adler (5 shared papers)
- Journals
- Microelectronic Engineering (11 papers)Japanese Journal of Applied Physics (5 papers)Applied Physics Letters (2 papers)Review of Scientific Instruments (1 paper)Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena (1 paper)
- Partner nations
- United StatesItalyBelgium
In The Last Decade
L. Grella
53 papers receiving 490 citations
Peers
Comparison fields: 5 of 52
- Structural Biology 55
- Surfaces, Coatings and Films 178
- Radiation 145
- Electrical and Electronic Engineering 340
- Biomedical Engineering 183
Countries citing papers authored by L. Grella
This map shows the geographic impact of L. Grella's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by L. Grella with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites L. Grella more than expected).
Fields of papers citing papers by L. Grella
This network shows the impact of papers produced by L. Grella. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by L. Grella. The network helps show where L. Grella may publish in the future.
Co-authors
The 25 scholars most cited alongside L. Grella, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 57 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 1992 | 83 | |
| 2 | 1995 | 42 | |
| 3 | 2012 | 34 | |
| 4 | 1994 | 33 | |
| 5 | 1990 | 25 | |
| 6 | 2009 | 22 | |
| 7 | 2009 | 22 | |
| 8 | 1997 | 18 | |
| 9 | 2003 | 17 | |
| 10 | 1997 | 17 | |
| 11 | 2004 | 17 | |
| 12 | 2010 | 16 | |
| 13 | 1996 | 13 | |
| 14 | 1996 | 13 | |
| 15 | 2003 | 12 | |
| 16 | 2004 | 12 | |
| 17 | 1993 | 11 | |
| 18 | 1994 | 8 | |
| 19 | 2014 | 7 | |
| 20 | 1996 | 6 |
About L. Grella
L. Grella is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films, Biomedical Engineering, Radiation and Atomic and Molecular Physics, and Optics, having authored 57 papers that have together received 523 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (45 papers), Electron and X-Ray Spectroscopy Techniques (29 papers), Integrated Circuits and Semiconductor Failure Analysis (11 papers), Optical Coatings and Gratings (10 papers), Advanced X-ray Imaging Techniques (7 papers), Advanced Surface Polishing Techniques (6 papers), Surface Roughness and Optical Measurements (4 papers) and Semiconductor materials and devices (4 papers). The work is most often cited by research in Structural Biology (55 citations), Surfaces, Coatings and Films (178 citations), Radiation (145 citations), Electrical and Electronic Engineering (340 citations) and Biomedical Engineering (183 citations). L. Grella has collaborated with scholars based in United States, Italy and Belgium. Frequent co-authors include M. Gentili, M. Baciocchi, Enzo Di Fabrizio, Gian F. Lorusso, W. Yun, Barry Lai, F. Cerrina, David Adler, D. Legnini and Yanan Xiao. Their work appears in journals such as Microelectronic Engineering, Japanese Journal of Applied Physics, Applied Physics Letters, Review of Scientific Instruments and Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.