K.Y. Chiu

485 citations

27 papers · 334 · h-index 10

Impact in

Electrical and Electronic Engineering top 10%
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Silicon Carbide Semiconductor Technologies
- Ferroelectric and Negative Capacitance Devices
- Silicon and Solar Cell Technologies
- Thin-Film Transistor Technologies
Atomic and Molecular Physics, and Optics
- Semiconductor materials and interfaces

Papers in

Electrical and Electronic Engineering 27
- Semiconductor materials and devices 24
- Advancements in Semiconductor Devices and Circuit Design 16
- Integrated Circuits and Semiconductor Failure Analysis 13
- Silicon and Solar Cell Technologies 4
Atomic and Molecular Physics, and Optics 5
- Semiconductor materials and interfaces 5

Co-authors: Fu‐Lan Hsu (3 shared papers)J.L. Moll (7 shared papers)T. R. Cass (3 shared papers)Tetsuya Iizuka (1 shared paper)Paul Merchant (3 shared papers)Sarah Angelos (2 shared papers)Craig Lage (2 shared papers)Runchen Fang (3 shared papers)
Journals: IEEE Transactions on Electron Devices (6 papers)IEEE Electron Device Letters (5 papers)IEEE Journal of Solid-State Circuits (1 paper)IEEE Transactions on Semiconductor Manufacturing (1 paper)Journal of The Electrochemical Society (1 paper)
Partner nations: United States Japan Taiwan

In The Last Decade

K.Y. Chiu

23 papers receiving 313 citations

Peers

Countries citing papers authored by K.Y. Chiu

Since Specialization

Citations

This map shows the geographic impact of K.Y. Chiu's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by K.Y. Chiu with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites K.Y. Chiu more than expected).

Fields of papers citing papers by K.Y. Chiu

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by K.Y. Chiu. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by K.Y. Chiu. The network helps show where K.Y. Chiu may publish in the future.

Co-authors

The 25 scholars most cited alongside K.Y. Chiu, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with K.Y. Chiu Line = papers co-authored together K.Y. Chiu links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

Showing the 20 most-cited of 27 papers — load more, or switch the sort, to bring in the rest.

#	Work
1	Temperature dependence of hot-electron-induced degradation in MOSFET's IEEE Electron Device Letters ·Fu‐Lan Hsu, K.Y. Chiu	1984	73
2	A bird's beak free local oxidation technology feasible for VLSI circuits fabrication IEEE Transactions on Electron Devices ·K.Y. Chiu, J.L. Moll, J. Manoliu	1982	54
3	Evaluation of LDD MOSFET's based on hot-electron-induced degradation IEEE Electron Device Letters ·Fu‐Lan Hsu, K.Y. Chiu	1984	33
4	The sloped-wall SWAMI—A defect-free zero bird's-beak local oxidation process for scaled VLSI technology IEEE Transactions on Electron Devices ·K.Y. Chiu, J.L. Moll, Kit Man Cham, Jung Lin, Craig Lage, Sarah Angelos, R. Tillman	1983	25
5	Double threshold MOSFETs in bird's-beak free structures Tetsuya Iizuka, K.Y. Chiu, J.L. Moll	1981	25
6	Effect of final annealing on hot-electron-induced MOSFET degradation IEEE Electron Device Letters ·Fu‐Lan Hsu, J. Hui, K.Y. Chiu	1985	24
7	HPSAC—A silicided amorphous-silicon contact and interconnect technology for VLSI IEEE Transactions on Electron Devices ·S.S. Wong, D.C. Chen, Paul Merchant, T. R. Cass, Jun Amano, K.Y. Chiu	1987	21
8	TiSi₂thickness limitations for use with shallow junctions and SWAMI or LOCOS isolation IEEE Transactions on Electron Devices ·D.C. Chen, T. R. Cass, J. E. Turner, Paul Merchant, K.Y. Chiu	1986	15
9	The SWAMI - A defect free and near-zero bird's-beak local oxidation process and its application in VLSI technology K.Y. Chiu, Runchen Fang, J. Lin, J.L. Moll, Craig Lage, Sarah Angelos, R. Tillman	1982	9
10	Hot-electron degradation in submicron VLSI Fu-Chieh Hsu, John Hui, K.Y. Chiu	1985	9
11	Improved flash cell performance by N/sub 2/O annealing of interpoly oxide IEEE Electron Device Letters ·Fuh-Cheng Jong, Tiao-Yuan Huang, Tien‐Sheng Chao, Horng−Chih Lin, Len-Yi Leu, K.K. Young, Chen-Hsi Lin, K.Y. Chiu	1997	7
12	Defect Characteristics and Generation Mechanism in a Bird Beak Free Structure by Sidewall Masked Technique Journal of The Electrochemical Society ·Runchen Fang, K.Y. Chiu, J.L. Moll	1983	6
13	Reduced oxide charge trapping and improved hot-electron reliability in submicrometer MOS devices fabricated by titanium salicide process IEEE Electron Device Letters ·Shuo-Tung Chang, K.Y. Chiu	1988	6
14	A Bird's Beak Free Local Oxidation Technology Feasible for VLSI Circuits Fabrication IEEE Journal of Solid-State Circuits ·K.Y. Chiu, J.L. Moll, J. Manoliu	1982	6
15	The impact of TiSi2 on shallow junctions D.C. Chen, T. R. Cass, J. E. Turner, Paul Merchant, K.Y. Chiu	1985	5
16	Radiation Effects on Semiconductor Materials and Devices. Defense Technical Information Center (DTIC) ·J. R. Srour, O. L. Curtis, S. Othmer, K.Y. Chiu, V. D. Deokar	1973	4
17	Design optimization methodology for deep-submicrometer CMOS device at low-temperature operation IEEE Transactions on Electron Devices ·M. Kakumu, Dethard Peters, H.-Y. Liu, K.Y. Chiu	1992	4
18	The SWAMI - A Defect Free and Near-Zero Bird's Beak Local Oxidation Technology for VLSI Symposium on VLSI Technology ·K.Y. Chiu, Runchen Fang, J. Lin, J.L. Moll	1982	2
19	Design optimization for deep-submicron CMOS device at low temperature operation M. Kakumu, David A. Peters, H.Y. Liu, K.Y. Chiu	2002	2
20	Effects of Device Processing on Hot-Electron Induced Device Degradation Symposium on VLSI Technology ·Fu-Chieh Hsu, K.Y. Chiu	1985	1

About K.Y. Chiu

K.Y. Chiu is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Mechanics of Materials, Electronic, Optical and Magnetic Materials and Biomedical Engineering, having authored 27 papers that have together received 334 indexed citations. Recurring topics across this work include Semiconductor materials and devices (24 papers), Advancements in Semiconductor Devices and Circuit Design (16 papers), Integrated Circuits and Semiconductor Failure Analysis (13 papers), Semiconductor materials and interfaces (5 papers), Silicon and Solar Cell Technologies (4 papers), Metal and Thin Film Mechanics (2 papers), Advanced Surface Polishing Techniques (2 papers) and Copper Interconnects and Reliability (2 papers). The work is most often cited by research in Electrical and Electronic Engineering (325 citations), Atomic and Molecular Physics, and Optics (56 citations), Materials Chemistry (26 citations), Electronic, Optical and Magnetic Materials (9 citations) and Hardware and Architecture (3 citations). K.Y. Chiu has collaborated with scholars based in United States, Japan and Taiwan. Frequent co-authors include Fu‐Lan Hsu, J.L. Moll, T. R. Cass, Tetsuya Iizuka, Paul Merchant, Sarah Angelos, Craig Lage, Runchen Fang, Fu-Chieh Hsu and Jun Amano. Their work appears in journals such as IEEE Transactions on Electron Devices, IEEE Electron Device Letters, IEEE Journal of Solid-State Circuits, IEEE Transactions on Semiconductor Manufacturing and Journal of The Electrochemical Society.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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