John W. Graff

529 citations
27 papers · 465 · h-index 12

Impact in

Papers in

John W. Graff

27 papers receiving 451 citations

Peers

John W. Graff
Comparison fields: 5 of 15
  • Condensed Matter Physics 359
  • Atomic and Molecular Physics, and Optics 82
  • Surfaces, Coatings and Films 12
  • Electrical and Electronic Engineering 93
  • Materials Chemistry 23
Replace Daisuke Muto with:
Daisuke Muto Japan
R. C. Tu Taiwan
Hai Lu United States
Masakazu Kuwabara Japan
Donald Dorman United States
Yoji Yamashita Japan
Nathan G. Young United States
Yuen‐Yee Wong Taiwan
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Citations per field
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Citations per year

Countries citing papers authored by John W. Graff

Since Specialization
Citations

This map shows the geographic impact of John W. Graff's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by John W. Graff with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites John W. Graff more than expected).

Fields of papers citing papers by John W. Graff

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by John W. Graff. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by John W. Graff. The network helps show where John W. Graff may publish in the future.

Co-authors

The 25 scholars most cited alongside John W. Graff, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with John W. Graff Line = papers co-authored together John W. Graff links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 27 papers — load more, or switch the sort, to bring in the rest.

#Work
1 200080
2 200162
3 200254
4 200349
5 200234
6 201424
7 200320
8 200019
9 200219
10 200216
11 201313
12 200112
13 200310
14 20009
15 20039
16 20038
17 20017
18 20026
19 20013
20 20002

About John W. Graff

John W. Graff is a scholar working on Condensed Matter Physics, Electrical and Electronic Engineering, Biomedical Engineering, Atomic and Molecular Physics, and Optics and Electronic, Optical and Magnetic Materials, having authored 27 papers that have together received 465 indexed citations. Recurring topics across this work include GaN-based semiconductor devices and materials (21 papers), Silicon and Solar Cell Technologies (4 papers), Semiconductor Lasers and Optical Devices (3 papers), Advanced optical system design (2 papers), Semiconductor materials and interfaces (2 papers), Silicon Carbide Semiconductor Technologies (2 papers), Plasmonic and Surface Plasmon Research (1 paper) and Metamaterials and Metasurfaces Applications (1 paper). The work is most often cited by research in Condensed Matter Physics (359 citations), Atomic and Molecular Physics, and Optics (82 citations), Surfaces, Coatings and Films (12 citations), Electrical and Electronic Engineering (93 citations) and Materials Chemistry (23 citations). John W. Graff has collaborated with scholars based in United States, Germany and Taiwan. Frequent co-authors include E. Fred Schubert, Th. Gessmann, Andrei V. Osinsky, Jinn‐Kong Sheu, Klaus P. Streubel, Christian Karnutsch, Leonid Chernyak, Vladimir N. Fuflyigin, R. F. Karlicek and Thomas Gessmann. Their work appears in journals such as Applied Physics Letters, physica status solidi (a), Journal of Applied Physics, Electronics Letters and IEEE Electron Device Letters.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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