Jerzy Rutkowski
Impact in
- Hardware and Architecture top 2%
- VLSI and Analog Circuit Testing
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- Engineering and Test Systems
- Fault Detection and Control Systems
Papers in
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- VLSI and Analog Circuit Testing 44
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- Integrated Circuits and Semiconductor Failure Analysis 28
- VLSI and FPGA Design Techniques 20
- Advanced Electrical Measurement Techniques 4
- Co-authors
- Damian Grzechca (37 shared papers)Janusz A. Starzyk (1 shared paper)Zhihong Liu (1 shared paper)Łukasz Zieliński (3 shared papers)Andrzej Polański (1 shared paper)
- Journals
- Bulletin of the Polish Academy of Sciences Technical Sciences (4 papers)Electronics Letters (2 papers)IEEE Transactions on Instrumentation and Measurement (1 paper)Metrology and Measurement Systems (3 papers)Lecture notes in computer science (1 paper)
- Partner nations
- PolandUnited StatesUnited Kingdom
In The Last Decade
Jerzy Rutkowski
62 papers receiving 465 citations
Peers
Comparison fields: 5 of 44
- Hardware and Architecture 350
- Control and Systems Engineering 176
- Electrical and Electronic Engineering 308
- Software 16
- Computer Science Applications 20
Countries citing papers authored by Jerzy Rutkowski
This map shows the geographic impact of Jerzy Rutkowski's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jerzy Rutkowski with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jerzy Rutkowski more than expected).
Fields of papers citing papers by Jerzy Rutkowski
This network shows the impact of papers produced by Jerzy Rutkowski. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jerzy Rutkowski. The network helps show where Jerzy Rutkowski may publish in the future.
Co-authors
The 5 scholars most cited alongside Jerzy Rutkowski, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 70 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2004 | 104 | |
| 2 | 2007 | 100 | |
| 3 | FAULT DIAGNOSIS IN ANALOG ELECTRONIC CIRCUITS - THE SVM APPROACH | 2009 | 25 |
| 4 | 2011 | 20 | |
| 5 | 2006 | 19 | |
| 6 | 2006 | 14 | |
| 7 | 2012 | 12 | |
| 8 | 2010 | 12 | |
| 9 | GLOBAL PARAMETRIC FAULT IDENTIFICATION IN ANALOG ELECTRONIC CIRCUITS | 2009 | 11 |
| 10 | 2008 | 9 | |
| 11 | Analog IC fault diagnosis by means of supply current monitoring in test points selected evolutionarily | 2010 | 8 |
| 12 | 2008 | 7 | |
| 13 | 2007 | 7 | |
| 14 | 2007 | 7 | |
| 15 | 2012 | 7 | |
| 16 | Finding of optimal excitation signal for testing of analog electronic circuits | 2007 | 6 |
| 17 | 2006 | 6 | |
| 18 | 2018 | 6 | |
| 19 | 2002 | 6 | |
| 20 | Heuristic methods to test frequencies optimization for analogue circuits diagnosis | 2008 | 5 |
About Jerzy Rutkowski
Jerzy Rutkowski is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering, Control and Systems Engineering, Artificial Intelligence and Media Technology, having authored 70 papers that have together received 514 indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (44 papers), Integrated Circuits and Semiconductor Failure Analysis (28 papers), VLSI and FPGA Design Techniques (20 papers), Experimental Learning in Engineering (10 papers), Evolutionary Algorithms and Applications (10 papers), Engineering and Test Systems (9 papers), Advanced Electrical Measurement Techniques (4 papers) and Neural Networks and Applications (4 papers). The work is most often cited by research in Hardware and Architecture (350 citations), Control and Systems Engineering (176 citations), Electrical and Electronic Engineering (308 citations), Software (16 citations) and Computer Science Applications (20 citations). Jerzy Rutkowski has collaborated with scholars based in Poland, United States and United Kingdom. Frequent co-authors include Damian Grzechca, Janusz A. Starzyk, Zhihong Liu, Łukasz Zieliński and Andrzej Polański. Their work appears in journals such as Bulletin of the Polish Academy of Sciences Technical Sciences, Electronics Letters, IEEE Transactions on Instrumentation and Measurement, Metrology and Measurement Systems and Lecture notes in computer science.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.