J.E. Crombeen
Impact in
- Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques
- Materials Chemistry top 10%
- Graphene research and applications
- Carbon Nanotubes in Composites
- Diamond and Carbon-based Materials Research
Papers in
-
- Semiconductor materials and devices 6
- Plasma Diagnostics and Applications 3
-
- Photocathodes and Microchannel Plates 5
- Co-authors
- A.J. Van Bommel (8 shared papers)J. P. W. B. Duchateau (3 shared papers)A. H. Reader (3 shared papers)E. Bruninx (1 shared paper)A. van Oostrom (1 shared paper)G.G.P. van Gorkom (1 shared paper)Marcel A.J. Somers (1 shared paper)P. C. Zalm (1 shared paper)
- Journals
- Surface Science (8 papers)Applied Surface Science (2 papers)Semiconductor Science and Technology (2 papers)IEEE Transactions on Electron Devices (2 papers)Applied Physics Letters (1 paper)
- Partner nations
- NetherlandsFinlandUnited States
In The Last Decade
J.E. Crombeen
17 papers receiving 938 citations
J.E. Crombeen's Hit Papers
Peers
Comparison fields: 5 of 45
- Surfaces, Coatings and Films 165
- Materials Chemistry 556
- Atomic and Molecular Physics, and Optics 322
- Electrical and Electronic Engineering 537
- Ceramics and Composites 31
Countries citing papers authored by J.E. Crombeen
This map shows the geographic impact of J.E. Crombeen's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J.E. Crombeen with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J.E. Crombeen more than expected).
Fields of papers citing papers by J.E. Crombeen
This network shows the impact of papers produced by J.E. Crombeen. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J.E. Crombeen. The network helps show where J.E. Crombeen may publish in the future.
Co-authors
The 8 scholars most cited alongside J.E. Crombeen, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | LEED and Auger electron observations of the SiC(0001) surface Hit paper breakdown → | 1975 | 588 |
| 2 | 1978 | 106 | |
| 3 | 1986 | 82 | |
| 4 | 1974 | 30 | |
| 5 | 1980 | 28 | |
| 6 | 1976 | 25 | |
| 7 | 1976 | 17 | |
| 8 | 1973 | 16 | |
| 9 | 1993 | 16 | |
| 10 | 1969 | 13 | |
| 11 | 1991 | 11 | |
| 12 | 1978 | 10 | |
| 13 | 1989 | 9 | |
| 14 | 1992 | 6 | |
| 15 | 1986 | 6 | |
| 16 | 1990 | 4 | |
| 17 | 2000 | 1 |
About J.E. Crombeen
J.E. Crombeen is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films and Radiation, having authored 17 papers that have together received 968 indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (6 papers), Semiconductor materials and devices (6 papers), Photocathodes and Microchannel Plates (5 papers), Semiconductor materials and interfaces (4 papers), Plasma Diagnostics and Applications (3 papers), Radiation Therapy and Dosimetry (2 papers), Radiation Detection and Scintillator Technologies (2 papers) and Nuclear Physics and Applications (2 papers). The work is most often cited by research in Surfaces, Coatings and Films (165 citations), Materials Chemistry (556 citations), Atomic and Molecular Physics, and Optics (322 citations), Electrical and Electronic Engineering (537 citations) and Ceramics and Composites (31 citations). J.E. Crombeen has collaborated with scholars based in Netherlands, Finland and United States. Frequent co-authors include A.J. Van Bommel, J. P. W. B. Duchateau, A. H. Reader, E. Bruninx, A. van Oostrom, G.G.P. van Gorkom, Marcel A.J. Somers and P. C. Zalm. Their work appears in journals such as Surface Science, Applied Surface Science, Semiconductor Science and Technology, IEEE Transactions on Electron Devices and Applied Physics Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.