A.J. Van Bommel
Impact in
- Surfaces, Coatings and Films top 2%
- Electron and X-Ray Spectroscopy Techniques
- Spectroscopy top 5%
- Molecular spectroscopy and chirality
Papers in
-
- Surface and Thin Film Phenomena 4
- Advanced Chemical Physics Studies 2
-
- Photocathodes and Microchannel Plates 5
- Co-authors
- J.E. Crombeen (8 shared papers)J. M. Bijvoet (2 shared papers)A Peerdeman (1 shared paper)F. Meyer (3 shared papers)Frank Meyer (1 shared paper)M Sparnaay (1 shared paper)
- Journals
- Surface Science (13 papers)Nature (1 paper)Acta Crystallographica (2 papers)
- Partner nations
- NetherlandsUnited States
In The Last Decade
A.J. Van Bommel
16 papers receiving 1.4k citations
A.J. Van Bommel's Hit Papers
Peers
Comparison fields: 5 of 84
- Surfaces, Coatings and Films 211
- Spectroscopy 251
- Materials Chemistry 676
- Physical and Theoretical Chemistry 115
- Atomic and Molecular Physics, and Optics 397
Countries citing papers authored by A.J. Van Bommel
This map shows the geographic impact of A.J. Van Bommel's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by A.J. Van Bommel with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites A.J. Van Bommel more than expected).
Fields of papers citing papers by A.J. Van Bommel
This network shows the impact of papers produced by A.J. Van Bommel. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by A.J. Van Bommel. The network helps show where A.J. Van Bommel may publish in the future.
Co-authors
The 6 scholars most cited alongside A.J. Van Bommel, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | LEED and Auger electron observations of the SiC(0001) surface Hit paper breakdown → | 1975 | 588 |
| 2 | Determination of the Absolute Configuration of Optically Active Compounds by Means of X-Rays Hit paper breakdown → | 1951 | 503 |
| 3 | 1978 | 106 | |
| 4 | 1967 | 51 | |
| 5 | 1967 | 46 | |
| 6 | 1958 | 39 | |
| 7 | 1974 | 30 | |
| 8 | 1980 | 28 | |
| 9 | 1976 | 25 | |
| 10 | 1976 | 17 | |
| 11 | 1973 | 16 | |
| 12 | 1967 | 15 | |
| 13 | 1978 | 10 | |
| 14 | 1968 | 8 | |
| 15 | 1973 | 7 | |
| 16 | 1964 | 2 |
About A.J. Van Bommel
A.J. Van Bommel is a scholar working on Atomic and Molecular Physics, and Optics, Biomedical Engineering, Surfaces, Coatings and Films, Electrical and Electronic Engineering and Radiation, having authored 16 papers that have together received 1.5k indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (6 papers), Photocathodes and Microchannel Plates (5 papers), Surface and Thin Film Phenomena (4 papers), Advanced Chemical Physics Studies (2 papers), Radiation Detection and Scintillator Technologies (2 papers), Nuclear Physics and Applications (2 papers), Chemical Thermodynamics and Molecular Structure (2 papers) and Semiconductor materials and devices (2 papers). The work is most often cited by research in Surfaces, Coatings and Films (211 citations), Spectroscopy (251 citations), Materials Chemistry (676 citations), Physical and Theoretical Chemistry (115 citations) and Atomic and Molecular Physics, and Optics (397 citations). A.J. Van Bommel has collaborated with scholars based in Netherlands and United States. Frequent co-authors include J.E. Crombeen, J. M. Bijvoet, A Peerdeman, F. Meyer, Frank Meyer and M Sparnaay. Their work appears in journals such as Surface Science, Nature and Acta Crystallographica.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.