J.-C. Labrune
Impact in
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- Semiconductor materials and interfaces
- Surface and Thin Film Phenomena
- Force Microscopy Techniques and Applications
Papers in
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- Semiconductor materials and interfaces 11
- Surface and Thin Film Phenomena 10
- Force Microscopy Techniques and Applications 5
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- Integrated Circuits and Semiconductor Failure Analysis 2
- Co-authors
- Frank Palmino (14 shared papers)C. Savall (6 shared papers)G. Bertrand (2 shared papers)Emmanuel Rocca (2 shared papers)Christophe Rapin (2 shared papers)P. Wetzel (5 shared papers)G. Gewinner (5 shared papers)Candido Fabrizio Pirri (3 shared papers)
- Journals
- Surface Science (7 papers)Physical review. B, Condensed matter (3 papers)Journal of Electroanalytical Chemistry (2 papers)Radiation Measurements (2 papers)Journal of Vacuum Science & Technology A Vacuum Surfaces and Films (2 papers)
- Partner nations
- FranceUnited States
In The Last Decade
J.-C. Labrune
22 papers receiving 338 citations
Peers
Comparison fields: 5 of 47
- Atomic and Molecular Physics, and Optics 212
- Metals and Alloys 16
- Electrochemistry 28
- Condensed Matter Physics 43
- Materials Chemistry 146
Countries citing papers authored by J.-C. Labrune
This map shows the geographic impact of J.-C. Labrune's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J.-C. Labrune with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J.-C. Labrune more than expected).
Fields of papers citing papers by J.-C. Labrune
This network shows the impact of papers produced by J.-C. Labrune. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J.-C. Labrune. The network helps show where J.-C. Labrune may publish in the future.
Co-authors
The 25 scholars most cited alongside J.-C. Labrune, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 24 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2001 | 68 | |
| 2 | 1995 | 38 | |
| 3 | 2000 | 38 | |
| 4 | 1996 | 34 | |
| 5 | 1997 | 31 | |
| 6 | 1997 | 28 | |
| 7 | 2002 | 22 | |
| 8 | 1996 | 16 | |
| 9 | 2004 | 16 | |
| 10 | 2005 | 14 | |
| 11 | 1999 | 7 | |
| 12 | 2005 | 6 | |
| 13 | 1983 | 5 | |
| 14 | 1999 | 5 | |
| 15 | 2000 | 3 | |
| 16 | 1983 | 3 | |
| 17 | 2006 | 3 | |
| 18 | 2002 | 3 | |
| 19 | 2000 | 1 | |
| 20 | 1999 | 1 |
About J.-C. Labrune
J.-C. Labrune is a scholar working on Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering, Biomedical Engineering, Materials Chemistry and Spectroscopy, having authored 24 papers that have together received 345 indexed citations. Recurring topics across this work include Semiconductor materials and interfaces (11 papers), Surface and Thin Film Phenomena (10 papers), Force Microscopy Techniques and Applications (5 papers), Spectroscopy and Laser Applications (3 papers), Ferroelectric and Piezoelectric Materials (3 papers), Advanced Materials Characterization Techniques (3 papers), Acoustic Wave Resonator Technologies (3 papers) and Integrated Circuits and Semiconductor Failure Analysis (2 papers). The work is most often cited by research in Atomic and Molecular Physics, and Optics (212 citations), Metals and Alloys (16 citations), Electrochemistry (28 citations), Condensed Matter Physics (43 citations) and Materials Chemistry (146 citations). J.-C. Labrune has collaborated with scholars based in France and United States. Frequent co-authors include Frank Palmino, C. Savall, G. Bertrand, Emmanuel Rocca, Christophe Rapin, P. Wetzel, G. Gewinner, Candido Fabrizio Pirri, C. Pirri and E. Ehret. Their work appears in journals such as Surface Science, Physical review. B, Condensed matter, Journal of Electroanalytical Chemistry, Radiation Measurements and Journal of Vacuum Science & Technology A Vacuum Surfaces and Films.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.