J.B. Pełka
Impact in
- Radiation top 5%
- Advanced X-ray Imaging Techniques
- Structural Biology top 10%
Papers in
-
- Integrated Circuits and Semiconductor Failure Analysis 5
- Co-authors
- W. Paszkowicz (9 shared papers)Michael Knapp (3 shared papers)Sławomir Podsiadło (2 shared papers)T. Szyszko (1 shared paper)W. Gerlach (2 shared papers)Mathias Brust (2 shared papers)A. Wawro (11 shared papers)Norbert Schell (2 shared papers)
In The Last Decade
J.B. Pełka
48 papers receiving 614 citations
Peers
Comparison fields: 5 of 67
- Radiation 88
- Structural Biology 13
- Materials Chemistry 326
- Condensed Matter Physics 58
- Computational Mechanics 88
Countries citing papers authored by J.B. Pełka
This map shows the geographic impact of J.B. Pełka's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J.B. Pełka with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J.B. Pełka more than expected).
Fields of papers citing papers by J.B. Pełka
This network shows the impact of papers produced by J.B. Pełka. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J.B. Pełka. The network helps show where J.B. Pełka may publish in the future.
Co-authors
The 25 scholars most cited alongside J.B. Pełka, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 48 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2002 | 269 | |
| 2 | 1983 | 53 | |
| 3 | 2005 | 48 | |
| 4 | 2006 | 35 | |
| 5 | 2007 | 26 | |
| 6 | 2002 | 15 | |
| 7 | 2002 | 15 | |
| 8 | 2009 | 13 | |
| 9 | 2008 | 12 | |
| 10 | 1996 | 11 | |
| 11 | 2004 | 9 | |
| 12 | 2015 | 9 | |
| 13 | 1989 | 9 | |
| 14 | 2004 | 8 | |
| 15 | 2001 | 8 | |
| 16 | 1984 | 7 | |
| 17 | 2001 | 7 | |
| 18 | 2009 | 6 | |
| 19 | 2003 | 6 | |
| 20 | 2003 | 5 |
About J.B. Pełka
J.B. Pełka is a scholar working on Electrical and Electronic Engineering, Materials Chemistry, Atomic and Molecular Physics, and Optics, Radiation and Computational Mechanics, having authored 48 papers that have together received 630 indexed citations. Recurring topics across this work include Advanced X-ray Imaging Techniques (9 papers), Magnetic properties of thin films (8 papers), X-ray Spectroscopy and Fluorescence Analysis (6 papers), Laser Material Processing Techniques (6 papers), Electron and X-Ray Spectroscopy Techniques (5 papers), Integrated Circuits and Semiconductor Failure Analysis (5 papers), Ion-surface interactions and analysis (4 papers) and Advanced Electron Microscopy Techniques and Applications (4 papers). The work is most often cited by research in Radiation (88 citations), Structural Biology (13 citations), Materials Chemistry (326 citations), Condensed Matter Physics (58 citations) and Computational Mechanics (88 citations). J.B. Pełka has collaborated with scholars based in Poland, Germany and Czechia. Frequent co-authors include W. Paszkowicz, Michael Knapp, Sławomir Podsiadło, T. Szyszko, W. Gerlach, Mathias Brust, A. Wawro, Norbert Schell, J. Krzywiński and L. Juha. Their work appears in journals such as Journal of Alloys and Compounds, Applied Physics Letters, Physica B Condensed Matter, Review of Scientific Instruments and Journal of Instrumentation.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.