James Walls
Impact in
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- Infrastructure Maintenance and Monitoring
- Asphalt Pavement Performance Evaluation
- Accounting top 10%
- Life Cycle Costing Analysis
Papers in
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- Semiconductor materials and devices 12
- Advancements in Semiconductor Devices and Circuit Design 7
- Electronic Packaging and Soldering Technologies 6
- Integrated Circuits and Semiconductor Failure Analysis 3
- Ferroelectric and Negative Capacitance Devices 1
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- Copper Interconnects and Reliability 9
- Co-authors
- Michael R. Smith (1 shared paper)Matthew Ryan Smith (1 shared paper)Rampi Ramprasad (2 shared papers)Tomasz Brożek (4 shared papers)David A. Roberts (1 shared paper)E. Luckowski (1 shared paper)A.M. Rogers (2 shared papers)D. A. Gajewski (2 shared papers)
- Journals
- Microelectronics Reliability (1 paper)Hispanic American Historical Review (1 paper)IEEE Transactions on Electron Devices (1 paper)IEEE Electron Device Letters (1 paper)Solid-State Electronics (1 paper)
- Partner nations
- United StatesGermany
In The Last Decade
James Walls
16 papers receiving 289 citations
Peers
Comparison fields: 5 of 46
- Civil and Structural Engineering 208
- Accounting 76
- Nuclear Energy and Engineering 3
- Building and Construction 55
- Transportation 18
Countries citing papers authored by James Walls
This map shows the geographic impact of James Walls's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by James Walls with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites James Walls more than expected).
Fields of papers citing papers by James Walls
This network shows the impact of papers produced by James Walls. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by James Walls. The network helps show where James Walls may publish in the future.
Co-authors
The 13 scholars most cited alongside James Walls, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | Life-Cycle Cost Analysis in Pavement Design — Interim Technical Bulletin | 1998 | 153 |
| 2 | Life Cycle Cost Analysis in Pavement Design: In Search of Better Investment Decisions | 1998 | 96 |
| 3 | 2003 | 30 | |
| 4 | 1995 | 24 | |
| 5 | 2004 | 8 | |
| 6 | 2002 | 8 | |
| 7 | 1997 | 8 | |
| 8 | 1996 | 4 | |
| 9 | 2004 | 3 | |
| 10 | 2000 | 3 | |
| 11 | 2016 | 2 | |
| 12 | 2003 | 2 | |
| 13 | 2010 | 1 | |
| 14 | 1977 | 1 | |
| 15 | 2001 | 1 | |
| 16 | 1973 | 1 | |
| 17 | 2002 | 1 | |
| 18 | 2017 | 0 |
About James Walls
James Walls is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Civil and Structural Engineering, Mechanics of Materials and Building and Construction, having authored 18 papers that have together received 346 indexed citations. Recurring topics across this work include Semiconductor materials and devices (12 papers), Copper Interconnects and Reliability (9 papers), Advancements in Semiconductor Devices and Circuit Design (7 papers), Electronic Packaging and Soldering Technologies (6 papers), Integrated Circuits and Semiconductor Failure Analysis (3 papers), Asphalt Pavement Performance Evaluation (2 papers), Metal and Thin Film Mechanics (2 papers) and Ferroelectric and Negative Capacitance Devices (1 paper). The work is most often cited by research in Civil and Structural Engineering (208 citations), Accounting (76 citations), Nuclear Energy and Engineering (3 citations), Building and Construction (55 citations) and Transportation (18 citations). James Walls has collaborated with scholars based in United States and Germany. Frequent co-authors include Michael R. Smith, Matthew Ryan Smith, Rampi Ramprasad, Tomasz Brożek, David A. Roberts, E. Luckowski, A.M. Rogers, D. A. Gajewski, Barry Commoner and Manfred Martin. Their work appears in journals such as Microelectronics Reliability, Hispanic American Historical Review, IEEE Transactions on Electron Devices, IEEE Electron Device Letters and Solid-State Electronics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.