J. Söchtig

485 citations
15 papers · 410 · h-index 9

Impact in

Papers in

J. Söchtig

14 papers receiving 387 citations

Peers

J. Söchtig
Comparison fields: 5 of 35
  • Surfaces, Coatings and Films 70
  • Atomic and Molecular Physics, and Optics 238
  • Electrical and Electronic Engineering 264
  • Radiation 24
  • Biomedical Engineering 94
Replace Y. J. van der Meulen with:
Y. J. van der Meulen United States
H. Lafontaine Canada
K. E. Strege United States
Tokuzo Sukegawa Japan
John E. Davey United States
G. A. Ausman United States
Yasushi Oshikane Japan
Wugen Pan Japan
J. Bonnafé France
K. Y. Lee United States
J. Söchtig relative to Y. J. van der Meulen United States Y. J. van der Meulen's profile →
Citations per field
00.5×
Y. J. van der Meulen · 1×
Citations per year

Countries citing papers authored by J. Söchtig

Since Specialization
Citations

This map shows the geographic impact of J. Söchtig's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Söchtig with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Söchtig more than expected).

Fields of papers citing papers by J. Söchtig

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. Söchtig. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Söchtig. The network helps show where J. Söchtig may publish in the future.

Co-authors

The 25 scholars most cited alongside J. Söchtig, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with J. Söchtig Line = papers co-authored together J. Söchtig links everyone, so they are left out of the graph.

All Works

15 of 15 papers shown
#Work
1 199692
2 200469
3 199453
4 200248
5 199545
6 199439
7 198822
8 199516
9 19968
10 20036
11 19945
12 20023
13 19852
14 20002
15 20040

About J. Söchtig

J. Söchtig is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Biomedical Engineering and Radiation, having authored 15 papers that have together received 410 indexed citations. Recurring topics across this work include Photonic and Optical Devices (10 papers), Semiconductor Lasers and Optical Devices (7 papers), Optical Coatings and Gratings (5 papers), Photorefractive and Nonlinear Optics (3 papers), Advanced Surface Polishing Techniques (3 papers), Semiconductor Quantum Structures and Devices (3 papers), Advanced Fiber Laser Technologies (2 papers) and Nuclear Materials and Properties (1 paper). The work is most often cited by research in Surfaces, Coatings and Films (70 citations), Atomic and Molecular Physics, and Optics (238 citations), Electrical and Electronic Engineering (264 citations), Radiation (24 citations) and Biomedical Engineering (94 citations). J. Söchtig has collaborated with scholars based in Switzerland, Germany and Italy. Frequent co-authors include Marc Schnieper, Ingo Baumann, J. E. Epler, Hans Thiele, Hans Zappe, Daniel Hofstetter, C. David, Michael T. Gale, W. Sohler and R. Corsini. Their work appears in journals such as Electronics Letters, Applied Physics Letters, Thin Solid Films, Optics and Lasers in Engineering and Microelectronic Engineering.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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