John E. Davey

694 citations
40 papers · 575 · h-index 15

Impact in

Papers in

John E. Davey

38 papers receiving 486 citations

Peers

John E. Davey
Comparison fields: 5 of 36
  • Atomic and Molecular Physics, and Optics 345
  • Surfaces, Coatings and Films 55
  • Electrical and Electronic Engineering 409
  • Materials Chemistry 197
  • Ceramics and Composites 21
Replace G. Jungk with:
G. Jungk Germany
E. Lugujjo United States
Y. J. van der Meulen United States
P. D. Augustus United Kingdom
K. E. Strege United States
J. D. Kuptsis United States
J. P. Gowers United Kingdom
Morio Inoue Japan
Akihiro Moritani Japan
R. R. Bradley United Kingdom
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Citations per field
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G. Jungk · 1×
Citations per year

Countries citing papers authored by John E. Davey

Since Specialization
Citations

This map shows the geographic impact of John E. Davey's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by John E. Davey with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites John E. Davey more than expected).

Fields of papers citing papers by John E. Davey

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by John E. Davey. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by John E. Davey. The network helps show where John E. Davey may publish in the future.

Co-authors

The 13 scholars most cited alongside John E. Davey, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with John E. Davey Line = papers co-authored together John E. Davey links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 40 papers — load more, or switch the sort, to bring in the rest.

#Work
1 196883
2 196343
3 197842
4 196436
5 196930
6 195729
7 196129
8 196526
9 196224
10 196622
11 197020
12 197818
13 196618
14 197017
15 198316
16 197413
17 197612
18 196512
19 198111
20 19809

About John E. Davey

John E. Davey is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Materials Chemistry, Surfaces, Coatings and Films and Biomedical Engineering, having authored 40 papers that have together received 575 indexed citations. Recurring topics across this work include Semiconductor materials and devices (15 papers), Semiconductor Quantum Structures and Devices (12 papers), Thin-Film Transistor Technologies (12 papers), Semiconductor materials and interfaces (11 papers), Silicon and Solar Cell Technologies (9 papers), Optical Coatings and Gratings (4 papers), Photonic and Optical Devices (4 papers) and Silicon Nanostructures and Photoluminescence (4 papers). The work is most often cited by research in Atomic and Molecular Physics, and Optics (345 citations), Surfaces, Coatings and Films (55 citations), Electrical and Electronic Engineering (409 citations), Materials Chemistry (197 citations) and Ceramics and Composites (21 citations). John E. Davey has collaborated with scholars based in United States. Frequent co-authors include Titus Pankey, A. Christou, W.T. Anderson, M. D. Montgomery, W. F. Tseng, P. R. Malmberg, H.B. Dietrich, Arrigo Addamiano, Gordon Wood Anderson and N. S. Saks. Their work appears in journals such as Journal of Applied Physics, Applied Physics Letters, Electronics Letters, Review of Scientific Instruments and Journal of Crystal Growth.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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