J. Rivory

76 papers receiving 1.2k citations

Peers

J. Rivory
Comparison fields: 5 of 69
  • Surfaces, Coatings and Films 231
  • Electronic, Optical and Magnetic Materials 280
  • Materials Chemistry 547
  • Atomic and Molecular Physics, and Optics 302
  • Electrical and Electronic Engineering 517
Replace William A. McGahan with:
William A. McGahan United States
Yuden Teraoka Japan
Paul G. Snyder United States
E. Zoethout Netherlands
G. Vuye France
B. G. Yacobi United States
Tomuo Yamaguchi Japan
Masahiro Kudo Japan
H. Yamamoto Japan
L.D. Laude Belgium
J. Rivory relative to William A. McGahan United States William A. McGahan's profile →
Citations per field
00.5×1.5×
William A. McGahan · 1×
Citations per year

Countries citing papers authored by J. Rivory

Since Specialization
Citations

This map shows the geographic impact of J. Rivory's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Rivory with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Rivory more than expected).

Fields of papers citing papers by J. Rivory

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. Rivory. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Rivory. The network helps show where J. Rivory may publish in the future.

Co-authors

The 25 scholars most cited alongside J. Rivory, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with J. Rivory Line = papers co-authored together J. Rivory links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 81 papers — load more, or switch the sort, to bring in the rest.

#Work
1 1993130
2 199582
3 199761
4 199758
5 198150
6 199246
7 200038
8 200436
9 199532
10 200028
11 198328
12 199428
13 199828
14 200226
15 201025
16 199825
17 198023
18 201222
19 197919
20 201018

About J. Rivory

J. Rivory is a scholar working on Electrical and Electronic Engineering, Materials Chemistry, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials and Computational Mechanics, having authored 81 papers that have together received 1.3k indexed citations. Recurring topics across this work include Optical Coatings and Gratings (13 papers), Silicon Nanostructures and Photoluminescence (11 papers), Thin-Film Transistor Technologies (11 papers), Semiconductor materials and devices (10 papers), Ion-surface interactions and analysis (9 papers), Plasmonic and Surface Plasmon Research (8 papers), Semiconductor materials and interfaces (8 papers) and Surface Roughness and Optical Measurements (8 papers). The work is most often cited by research in Surfaces, Coatings and Films (231 citations), Electronic, Optical and Magnetic Materials (280 citations), Materials Chemistry (547 citations), Atomic and Molecular Physics, and Optics (302 citations) and Electrical and Electronic Engineering (517 citations). J. Rivory has collaborated with scholars based in France, Sweden and Canada. Frequent co-authors include S. Fisson, G. Vuye, Vien Van, F. Abelès, Bruno Gallas, A. Brunet‐Bruneau, S. Martin, Marc Schoenauer, K. Yu-Zhang and Serge Berthier. Their work appears in journals such as Thin Solid Films, Journal of Applied Physics, Solid State Communications, Physical review. B, Condensed matter and Optics Communications.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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