J. Giess

616 citations
45 papers · 482 · h-index 13

Impact in

Papers in

J. Giess

43 papers receiving 448 citations

Peers

J. Giess
Comparison fields: 5 of 32
  • Atomic and Molecular Physics, and Optics 263
  • Electrical and Electronic Engineering 418
  • Materials Chemistry 161
  • Instrumentation 11
  • Radiation 19
Replace Janet E. Hails with:
Janet E. Hails United Kingdom
Shin Mou United States
Charles J. Reyner United States
G. Ciullo Italy
A. Royle United Kingdom
G. Bougnot France
Daniele Alderighi Italy
Y. Hirota Japan
R. Korenstein United States
Y. X. Xia China
J. Giess relative to Janet E. Hails United Kingdom Janet E. Hails's profile →
Citations per field
00.5×1.5×
Janet E. Hails · 1×
Citations per year

Countries citing papers authored by J. Giess

Since Specialization
Citations

This map shows the geographic impact of J. Giess's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Giess with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Giess more than expected).

Fields of papers citing papers by J. Giess

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. Giess. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Giess. The network helps show where J. Giess may publish in the future.

Co-authors

The 25 scholars most cited alongside J. Giess, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with J. Giess Line = papers co-authored together J. Giess links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 45 papers — load more, or switch the sort, to bring in the rest.

#Work
1 198544
2 198936
3 198536
4 198533
5 198832
6 199028
7 198623
8 198522
9 200421
10 200318
11 198617
12 200516
13 199015
14 200812
15 200510
16 19869
17 20079
18 19918
19 19908
20 19958

About J. Giess

J. Giess is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Materials Chemistry, Aerospace Engineering and Spectroscopy, having authored 45 papers that have together received 482 indexed citations. Recurring topics across this work include Advanced Semiconductor Detectors and Materials (45 papers), Chalcogenide Semiconductor Thin Films (26 papers), Semiconductor Quantum Structures and Devices (24 papers), Infrared Target Detection Methodologies (6 papers), Calibration and Measurement Techniques (4 papers), Quantum Dots Synthesis And Properties (4 papers), Spectroscopy and Laser Applications (3 papers) and Machine Learning in Materials Science (3 papers). The work is most often cited by research in Atomic and Molecular Physics, and Optics (263 citations), Electrical and Electronic Engineering (418 citations), Materials Chemistry (161 citations), Instrumentation (11 citations) and Radiation (19 citations). J. Giess has collaborated with scholars based in United Kingdom, United States and Sweden. Frequent co-authors include S.J.C. Irvine, J.B. Mullin, A. Royle, G. W. Blackmore, Janet E. Hails, Neil T. Gordon, O. D. Dosser, David J. Cole‐Hamilton, A.M. Keir and Anthony Graham. Their work appears in journals such as Journal of Crystal Growth, Journal of Electronic Materials, Applied Physics Letters, Journal of Applied Physics and Applied Surface Science.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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