J. Giess
Impact in
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- Semiconductor Quantum Structures and Devices
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- Advanced Semiconductor Detectors and Materials
- Chalcogenide Semiconductor Thin Films
Papers in
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- Advanced Semiconductor Detectors and Materials 46
- Chalcogenide Semiconductor Thin Films 27
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- Semiconductor Quantum Structures and Devices 25
- Co-authors
- S.J.C. Irvine (19 shared papers)J.B. Mullin (14 shared papers)A. Royle (9 shared papers)G. W. Blackmore (8 shared papers)Janet E. Hails (21 shared papers)Neil T. Gordon (19 shared papers)O. D. Dosser (2 shared papers)David J. Cole‐Hamilton (4 shared papers)
- Journals
- Journal of Crystal Growth (10 papers)Journal of Electronic Materials (6 papers)Applied Physics Letters (2 papers)Journal of Applied Physics (2 papers)Surface and Interface Analysis (1 paper)
- Partner nations
- United KingdomUnited StatesSweden
In The Last Decade
J. Giess
43 papers receiving 482 citations
Peers
Comparison fields: 5 of 34
- Atomic and Molecular Physics, and Optics 291
- Electrical and Electronic Engineering 460
- Instrumentation 16
- Materials Chemistry 177
- Surfaces, Coatings and Films 17
Countries citing papers authored by J. Giess
This map shows the geographic impact of J. Giess's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Giess with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Giess more than expected).
Fields of papers citing papers by J. Giess
This network shows the impact of papers produced by J. Giess. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Giess. The network helps show where J. Giess may publish in the future.
Co-authors
The 25 scholars most cited alongside J. Giess, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 46 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 1985 | 46 | |
| 2 | 1989 | 39 | |
| 3 | 1985 | 38 | |
| 4 | 1988 | 38 | |
| 5 | 1985 | 36 | |
| 6 | 1990 | 31 | |
| 7 | 1986 | 26 | |
| 8 | 2004 | 24 | |
| 9 | 1985 | 22 | |
| 10 | 1986 | 19 | |
| 11 | 1990 | 19 | |
| 12 | 2003 | 18 | |
| 13 | 2005 | 17 | |
| 14 | 2008 | 13 | |
| 15 | 2005 | 11 | |
| 16 | 2003 | 11 | |
| 17 | 2007 | 10 | |
| 18 | 1995 | 10 | |
| 19 | 1986 | 10 | |
| 20 | 1991 | 9 |
About J. Giess
J. Giess is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Materials Chemistry, Aerospace Engineering and Spectroscopy, having authored 46 papers that have together received 535 indexed citations. Recurring topics across this work include Advanced Semiconductor Detectors and Materials (46 papers), Chalcogenide Semiconductor Thin Films (27 papers), Semiconductor Quantum Structures and Devices (25 papers), Infrared Target Detection Methodologies (6 papers), Quantum Dots Synthesis And Properties (4 papers), Calibration and Measurement Techniques (4 papers), Machine Learning in Materials Science (3 papers) and Spectroscopy and Laser Applications (3 papers). The work is most often cited by research in Atomic and Molecular Physics, and Optics (291 citations), Electrical and Electronic Engineering (460 citations), Instrumentation (16 citations), Materials Chemistry (177 citations) and Surfaces, Coatings and Films (17 citations). J. Giess has collaborated with scholars based in United Kingdom, United States and Sweden. Frequent co-authors include S.J.C. Irvine, J.B. Mullin, A. Royle, G. W. Blackmore, Janet E. Hails, Neil T. Gordon, O. D. Dosser, David J. Cole‐Hamilton, Anthony Graham and A.M. Keir. Their work appears in journals such as Journal of Crystal Growth, Journal of Electronic Materials, Applied Physics Letters, Journal of Applied Physics and Surface and Interface Analysis.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.