J. Ellsworth
Impact in
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- Semiconductor Quantum Structures and Devices
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- Advanced Semiconductor Detectors and Materials
- Chalcogenide Semiconductor Thin Films
Papers in
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- Advanced Semiconductor Detectors and Materials 16
- Chalcogenide Semiconductor Thin Films 11
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- Semiconductor Quantum Structures and Devices 7
- Co-authors
- H. R. Vydyanath (9 shared papers)Carl J. Johnson (4 shared papers)James J. Kennedy (4 shared papers)Brian Dean (2 shared papers)Pok‐Kai Liao (2 shared papers)D. D. Edwall (5 shared papers)E. C. Piquette (3 shared papers)M. Zandian (2 shared papers)
- Journals
- Journal of Electronic Materials (10 papers)Journal of Applied Physics (1 paper)Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena (2 papers)Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE (3 papers)
- Partner nations
- United StatesAustralia
In The Last Decade
J. Ellsworth
18 papers receiving 335 citations
Peers
Comparison fields: 5 of 23
- Atomic and Molecular Physics, and Optics 190
- Electrical and Electronic Engineering 343
- Instrumentation 14
- Radiation 22
- Materials Chemistry 110
Countries citing papers authored by J. Ellsworth
This map shows the geographic impact of J. Ellsworth's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Ellsworth with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Ellsworth more than expected).
Fields of papers citing papers by J. Ellsworth
This network shows the impact of papers produced by J. Ellsworth. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Ellsworth. The network helps show where J. Ellsworth may publish in the future.
Co-authors
The 25 scholars most cited alongside J. Ellsworth, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1992 | 65 | |
| 2 | 1987 | 57 | |
| 3 | 2020 | 42 | |
| 4 | 2012 | 32 | |
| 5 | 1993 | 30 | |
| 6 | 2004 | 27 | |
| 7 | 2004 | 24 | |
| 8 | 1993 | 22 | |
| 9 | 2007 | 20 | |
| 10 | 2017 | 12 | |
| 11 | 1989 | 5 | |
| 12 | 2001 | 4 | |
| 13 | 1991 | 4 | |
| 14 | 1994 | 3 | |
| 15 | 1994 | 2 | |
| 16 | 1986 | 2 | |
| 17 | 2011 | 2 | |
| 18 | 2022 | 1 |
About J. Ellsworth
J. Ellsworth is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Materials Chemistry, Biomedical Engineering and Aerospace Engineering, having authored 18 papers that have together received 354 indexed citations. Recurring topics across this work include Advanced Semiconductor Detectors and Materials (16 papers), Chalcogenide Semiconductor Thin Films (11 papers), Semiconductor Quantum Structures and Devices (7 papers), Advanced X-ray and CT Imaging (3 papers), Quantum Dots Synthesis And Properties (3 papers), Calibration and Measurement Techniques (2 papers), Infrared Target Detection Methodologies (2 papers) and Electronic and Structural Properties of Oxides (2 papers). The work is most often cited by research in Atomic and Molecular Physics, and Optics (190 citations), Electrical and Electronic Engineering (343 citations), Instrumentation (14 citations), Radiation (22 citations) and Materials Chemistry (110 citations). J. Ellsworth has collaborated with scholars based in United States and Australia. Frequent co-authors include H. R. Vydyanath, Carl J. Johnson, James J. Kennedy, Brian Dean, Pok‐Kai Liao, D. D. Edwall, E. C. Piquette, M. Zandian, Michael Carmody and J. M. Arias. Their work appears in journals such as Journal of Electronic Materials, Journal of Applied Physics, Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena and Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.