J. C. Bean

5.2k citations
67 papers · 4.0k · 2 hit papers · h-index 27

Impact in

Papers in

J. C. Bean

64 papers receiving 3.8k citations

J. C. Bean's Hit Papers

Calculation of critical layer thickness versus lattice mismatch for GexSi1−x/Si strained-layer heterostructures 1985 · 1.4k citations
1.4k0+14+28Years since publication4008001.2k

Peers

J. C. Bean
Comparison fields: 5 of 54
  • Structural Biology 121
  • Atomic and Molecular Physics, and Optics 2.5k
  • Electrical and Electronic Engineering 3.1k
  • Surfaces, Coatings and Films 245
  • Materials Chemistry 1.5k
Replace Y. W. Mo with:
Y. W. Mo United States
H.‐J. Gossmann United States
D. C. Houghton Canada
R. Ludeke United States
W. Jäger Germany
J. Derrien France
W. Schröter Germany
H. Alexander Germany
J. M. Woodall United States
N. G. Chew United Kingdom
J. C. Bean relative to Y. W. Mo United States Y. W. Mo's profile →
Citations per field
00.5×1.5×1.8×
Y. W. Mo · 1×
Citations per year

Countries citing papers authored by J. C. Bean

Since Specialization
Citations

This map shows the geographic impact of J. C. Bean's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. C. Bean with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. C. Bean more than expected).

Fields of papers citing papers by J. C. Bean

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. C. Bean. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. C. Bean. The network helps show where J. C. Bean may publish in the future.

Co-authors

The 25 scholars most cited alongside J. C. Bean, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with J. C. Bean Line = papers co-authored together J. C. Bean links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 67 papers — load more, or switch the sort, to bring in the rest.

#Work
1
Calculation of critical layer thickness versus lattice mismatch for GexSi1−x/Si strained-layer heterostructures
Hit paper breakdown →
19851377
2 1986248
3
Modulation doping in GexSi1−x/Si strained layer heterostructures
Hit paper breakdown →
1984243
4 1985236
5 1984170
6 1977144
7 1989125
8 1986120
9 1984120
10 1994100
11 198985
12 198579
13 198070
14 199470
15 198463
16 199860
17 198558
18 199257
19 198950
20 198949

About J. C. Bean

J. C. Bean is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Materials Chemistry, Biomedical Engineering and Surfaces, Coatings and Films, having authored 67 papers that have together received 4.0k indexed citations. Recurring topics across this work include Silicon Nanostructures and Photoluminescence (26 papers), Semiconductor Quantum Structures and Devices (21 papers), Semiconductor materials and interfaces (20 papers), Semiconductor materials and devices (15 papers), Silicon and Solar Cell Technologies (13 papers), Photonic and Optical Devices (12 papers), Thin-Film Transistor Technologies (11 papers) and Surface and Thin Film Phenomena (8 papers). The work is most often cited by research in Structural Biology (121 citations), Atomic and Molecular Physics, and Optics (2.5k citations), Electrical and Electronic Engineering (3.1k citations), Surfaces, Coatings and Films (245 citations) and Materials Chemistry (1.5k citations). J. C. Bean has collaborated with scholars based in United States, Germany and South Africa. Frequent co-authors include R. People, R. Hull, A. T. Fiory, D. V. Lang, A. M. Sergent, L. C. Feldman, R. T. Lynch, J. M. Gibson, J. M. Poate and P. M. Petroff. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, Physical review. B, Condensed matter and Surface Science.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact