H. Brut

604 citations
15 papers · 264 · h-index 8

Impact in

    • Advancements in Semiconductor Devices and Circuit Design
    • Semiconductor materials and devices
    • Integrated Circuits and Semiconductor Failure Analysis
    • Low-power high-performance VLSI design
    • Silicon Carbide Semiconductor Technologies
    • Ferroelectric and Negative Capacitance Devices
    • VLSI and Analog Circuit Testing

Papers in

    • Semiconductor materials and devices 12
    • Advancements in Semiconductor Devices and Circuit Design 11
    • Integrated Circuits and Semiconductor Failure Analysis 5
    • Ferroelectric and Negative Capacitance Devices 2
    • Silicon Carbide Semiconductor Technologies 2
    • Low-power high-performance VLSI design 1
    • VLSI and Analog Circuit Testing 3

H. Brut

15 papers receiving 252 citations

Peers

H. Brut
Comparison fields: 5 of 7
  • Electrical and Electronic Engineering 263
  • Hardware and Architecture 18
  • Biomedical Engineering 35
  • Atomic and Molecular Physics, and Optics 10
  • Condensed Matter Physics 2
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H. Brut relative to Stephen G. Beebe United States Stephen G. Beebe's profile →
Citations per field
00.5×1.5×
Stephen G. Beebe · 1×
Citations per year

Countries citing papers authored by H. Brut

Since Specialization
Citations

This map shows the geographic impact of H. Brut's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by H. Brut with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites H. Brut more than expected).

Fields of papers citing papers by H. Brut

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by H. Brut. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by H. Brut. The network helps show where H. Brut may publish in the future.

Co-authors

The 25 scholars most cited alongside H. Brut, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with H. Brut Line = papers co-authored together H. Brut links everyone, so they are left out of the graph.

All Works

15 of 15 papers shown
#Work
1 200687
2 200758
3 200255
4 200816
5 19957
6 20027
7 20027
8 20037
9 20095
10 20045
11
New Method for the Extraction of the Gate Voltage Dependence of the Series Resistance in CMOS Transistors
19964
12 20043
13 20031
14 20081
15 20041

About H. Brut

H. Brut is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Biomedical Engineering, Instrumentation and Aerospace Engineering, having authored 15 papers that have together received 264 indexed citations. Recurring topics across this work include Semiconductor materials and devices (12 papers), Advancements in Semiconductor Devices and Circuit Design (11 papers), Integrated Circuits and Semiconductor Failure Analysis (5 papers), VLSI and Analog Circuit Testing (3 papers), Analog and Mixed-Signal Circuit Design (2 papers), Ferroelectric and Negative Capacitance Devices (2 papers), Silicon Carbide Semiconductor Technologies (2 papers) and Low-power high-performance VLSI design (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (263 citations), Hardware and Architecture (18 citations), Biomedical Engineering (35 citations), Atomic and Molecular Physics, and Optics (10 citations) and Condensed Matter Physics (2 citations). H. Brut has collaborated with scholars based in France, Switzerland and United States. Frequent co-authors include N. Planes, R. Gwoziecki, Dominique Fleury, G. Ghibaudo, J. Pretet, T. Poiroux, Takuma Matsumoto, S. Cristoloveanu, A. Pouydebasque and A. Juge. Their work appears in journals such as IEEE Transactions on Nanotechnology, IEEE Transactions on Semiconductor Manufacturing, Electronics Letters, HAL (Le Centre pour la Communication Scientifique Directe) and European Solid-State Device Research Conference.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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