G. Hollinger

9.2k citations
170 papers · 8.3k · 2 hit papers · h-index 43

Impact in

Papers in

G. Hollinger

166 papers receiving 7.9k citations

G. Hollinger's Hit Papers

Microscopic structure of theSiO2/Si interface 1988 · 1.6k citations
1.6k0+14+28Years since publication50010001.5k

Peers

G. Hollinger
Comparison fields: 5 of 87
  • Surfaces, Coatings and Films 1.6k
  • Electrical and Electronic Engineering 6.0k
  • Atomic and Molecular Physics, and Optics 3.0k
  • Materials Chemistry 4.1k
  • Structural Biology 98
Replace P. Soukiassian with:
P. Soukiassian France
G. S. Higashi United States
H. Wagner Germany
C. Oshima Japan
Peter Mark United States
J. L. Freeouf United States
J. M. Blakely United States
C. R. Helms United States
J. Zegenhagen Germany
Ulrich Starke Germany
G. Hollinger relative to P. Soukiassian France P. Soukiassian's profile →
Citations per field
00.5×
P. Soukiassian · 1×
Citations per year

Countries citing papers authored by G. Hollinger

Since Specialization
Citations

This map shows the geographic impact of G. Hollinger's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by G. Hollinger with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites G. Hollinger more than expected).

Fields of papers citing papers by G. Hollinger

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by G. Hollinger. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by G. Hollinger. The network helps show where G. Hollinger may publish in the future.

Co-authors

The 25 scholars most cited alongside G. Hollinger, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with G. Hollinger Line = papers co-authored together G. Hollinger links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 170 papers — load more, or switch the sort, to bring in the rest.

#Work
1
Microscopic structure of theSiO2/Si interface
Hit paper breakdown →
19881634
2
Probing the transition layer at the SiO2-Si interface using core level photoemission
Hit paper breakdown →
1984409
3 1983351
4 1994283
5 1983242
6 1985227
7 1985226
8 1986210
9 1983208
10 1988185
11 2007164
12 1981132
13 1998119
14 1986119
15 1976115
16 1975107
17 201198
18 199091
19 198191
20 200286

About G. Hollinger

G. Hollinger is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Materials Chemistry, Surfaces, Coatings and Films and Biomedical Engineering, having authored 170 papers that have together received 8.3k indexed citations. Recurring topics across this work include Semiconductor materials and devices (97 papers), Semiconductor Quantum Structures and Devices (52 papers), Electronic and Structural Properties of Oxides (40 papers), Electron and X-Ray Spectroscopy Techniques (37 papers), Semiconductor materials and interfaces (28 papers), Advanced Semiconductor Detectors and Materials (28 papers), Silicon Nanostructures and Photoluminescence (18 papers) and Semiconductor Lasers and Optical Devices (14 papers). The work is most often cited by research in Surfaces, Coatings and Films (1.6k citations), Electrical and Electronic Engineering (6.0k citations), Atomic and Molecular Physics, and Optics (3.0k citations), Materials Chemistry (4.1k citations) and Structural Biology (98 citations). G. Hollinger has collaborated with scholars based in France, United States and Belgium. Frequent co-authors include F. J. Himpsel, F. J. Himpsel, F. R. McFeely, A. Taleb‐Ibrahimi, J. A. Yarmoff, M. Gendry, E. Bergignat, Trần Minh Đức, Y. Robach and J. F. Morar. Their work appears in journals such as Applied Physics Letters, Physical review. B, Condensed matter, Journal of Applied Physics, Thin Solid Films and Surface Science.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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