Y. Robach
Impact in
- Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques
-
- Semiconductor Quantum Structures and Devices
- Semiconductor materials and interfaces
Papers in
-
- Semiconductor materials and devices 31
-
- Semiconductor Quantum Structures and Devices 16
- Semiconductor materials and interfaces 11
- Surface and Thin Film Phenomena 4
- Force Microscopy Techniques and Applications 4
- Co-authors
- G. Hollinger (25 shared papers)J. Joseph (13 shared papers)E. Bergignat (8 shared papers)M. Gendry (21 shared papers)L. Porte (15 shared papers)Mario El Kazzi (8 shared papers)Clément Merckling (5 shared papers)Gabriel Delhaye (5 shared papers)
- Journals
- Applied Physics Letters (6 papers)Journal of Applied Physics (6 papers)Thin Solid Films (6 papers)Surface Science (6 papers)Applied Surface Science (4 papers)
- Partner nations
- FranceSwitzerlandCanada
In The Last Decade
Y. Robach
55 papers receiving 930 citations
Peers
Comparison fields: 5 of 47
- Surfaces, Coatings and Films 103
- Atomic and Molecular Physics, and Optics 434
- Electrical and Electronic Engineering 715
- Materials Chemistry 546
- Electronic, Optical and Magnetic Materials 119
Countries citing papers authored by Y. Robach
This map shows the geographic impact of Y. Robach's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Y. Robach with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Y. Robach more than expected).
Fields of papers citing papers by Y. Robach
This network shows the impact of papers produced by Y. Robach. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Y. Robach. The network helps show where Y. Robach may publish in the future.
Co-authors
The 25 scholars most cited alongside Y. Robach, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 58 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 1985 | 220 | |
| 2 | 1987 | 75 | |
| 3 | 2006 | 65 | |
| 4 | 2008 | 34 | |
| 5 | 1986 | 32 | |
| 6 | 2011 | 30 | |
| 7 | 2007 | 29 | |
| 8 | 1998 | 26 | |
| 9 | 1992 | 25 | |
| 10 | 2007 | 23 | |
| 11 | 2007 | 22 | |
| 12 | 1997 | 21 | |
| 13 | 1997 | 18 | |
| 14 | 1987 | 18 | |
| 15 | 2007 | 18 | |
| 16 | 2003 | 17 | |
| 17 | 1992 | 16 | |
| 18 | 2019 | 16 | |
| 19 | 2002 | 15 | |
| 20 | 2006 | 15 |
About Y. Robach
Y. Robach is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Materials Chemistry, Biomedical Engineering and Electronic, Optical and Magnetic Materials, having authored 58 papers that have together received 955 indexed citations. Recurring topics across this work include Semiconductor materials and devices (31 papers), Electronic and Structural Properties of Oxides (17 papers), Semiconductor Quantum Structures and Devices (16 papers), Silicon Nanostructures and Photoluminescence (11 papers), Semiconductor materials and interfaces (11 papers), Ferroelectric and Piezoelectric Materials (9 papers), Surface and Thin Film Phenomena (4 papers) and Force Microscopy Techniques and Applications (4 papers). The work is most often cited by research in Surfaces, Coatings and Films (103 citations), Atomic and Molecular Physics, and Optics (434 citations), Electrical and Electronic Engineering (715 citations), Materials Chemistry (546 citations) and Electronic, Optical and Magnetic Materials (119 citations). Y. Robach has collaborated with scholars based in France, Switzerland and Canada. Frequent co-authors include G. Hollinger, J. Joseph, E. Bergignat, M. Gendry, L. Porte, Mario El Kazzi, Clément Merckling, Gabriel Delhaye, G. Grenet and G. Patriarche. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics, Thin Solid Films, Surface Science and Applied Surface Science.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.