Frédéric Bancel

451 citations
14 papers · 363 · h-index 7

Impact in

    • Physical Unclonable Functions (PUFs) and Hardware Security
    • VLSI and Analog Circuit Testing
    • Cryptographic Implementations and Security
    • Security and Verification in Computing
    • Coding theory and cryptography

Papers in

Journals
Journal of Electronic Testing (1 paper)Proceedings/Proceedings - International Test Conference (1 paper)International Conference on VLSI Design (1 paper)Design, Automation & Test in Europe Conference (DATE) (1 paper)Proceedings - IEEE International Parallel and Distributed Processing Symposium (1 paper)
Partner nations
France

In The Last Decade

Frédéric Bancel

13 papers receiving 353 citations

Peers

Frédéric Bancel
Comparison fields: 5 of 12
  • Hardware and Architecture 296
  • Artificial Intelligence 155
  • Information Systems 9
  • Computer Networks and Communications 6
  • Software 1
Replace Pawel Swierczynski with:
Pawel Swierczynski Germany
Jean Joaquim da Rolt France
Alexandra Jimborean Sweden
Adib Nahiyan United States
Toru Kisuki Netherlands
Anuj Dubey United States
Nidhal Selmane France
Sayandeep Saha India
David Goodwin United States
Brice Colombier France
Frédéric Bancel relative to Pawel Swierczynski Germany Pawel Swierczynski's profile →
Citations per field
00.5×1.5×2×
Pawel Swierczynski · 1×
Citations per year

Countries citing papers authored by Frédéric Bancel

Since Specialization
Citations

This map shows the geographic impact of Frédéric Bancel's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Frédéric Bancel with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Frédéric Bancel more than expected).

Fields of papers citing papers by Frédéric Bancel

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Frédéric Bancel. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Frédéric Bancel. The network helps show where Frédéric Bancel may publish in the future.

Co-authors

The 8 scholars most cited alongside Frédéric Bancel, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Frédéric Bancel Line = papers co-authored together Frédéric Bancel links everyone, so they are left out of the graph.

All Works

14 of 14 papers shown
#Work
1 200486
2
Scan Design and Secure Chip
200875
3 200573
4 200639
5 200738
6 200618
7 200617
8 20075
9 20024
10
Scan Pattern Watermarking
20063
11 20062
12 20062
13 20021
14 20050

About Frédéric Bancel

Frédéric Bancel is a scholar working on Hardware and Architecture, Artificial Intelligence, Computer Vision and Pattern Recognition, Electrical and Electronic Engineering and Nuclear Energy and Engineering, having authored 14 papers that have together received 363 indexed citations. Recurring topics across this work include Physical Unclonable Functions (PUFs) and Hardware Security (9 papers), VLSI and Analog Circuit Testing (6 papers), Cryptographic Implementations and Security (3 papers), Radiation Effects in Electronics (1 paper) and Advanced Steganography and Watermarking Techniques (1 paper). The work is most often cited by research in Hardware and Architecture (296 citations), Artificial Intelligence (155 citations), Information Systems (9 citations), Computer Networks and Communications (6 citations) and Software (1 citation). Frédéric Bancel has collaborated with scholars based in France. Frequent co-authors include David Hély, Marie-Lise Flottes, Bruno Rouzeyre, M. Renovell, Assia Tria, Yves Bertrand, Lionel Torres and Gilles Sassatelli. Their work appears in journals such as Journal of Electronic Testing, Proceedings/Proceedings - International Test Conference, International Conference on VLSI Design, Design, Automation & Test in Europe Conference (DATE) and Proceedings - IEEE International Parallel and Distributed Processing Symposium.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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