Evgeny E. Glickman
Impact in
- Metals and Alloys top 10%
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- Copper Interconnects and Reliability
Papers in
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- Copper Interconnects and Reliability 31
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- Electronic Packaging and Soldering Technologies 16
- Electrodeposition and Electroless Coatings 6
- Semiconductor materials and devices 6
- Co-authors
- Menachem Nathan (8 shared papers)Alexandra Inberg (7 shared papers)Nick Fishelson (3 shared papers)Yosi Shacham‐Diamand (6 shared papers)Leonid M. Klinger (6 shared papers)Noam Eliaz (3 shared papers)Yossi Lereah (2 shared papers)Alexander Gladkikh (2 shared papers)
- Journals
- Defect and diffusion forum/Diffusion and defect data, solid state data. Part A, Defect and diffusion forum (10 papers)Microelectronic Engineering (7 papers)Journal of Applied Physics (4 papers)Applied Physics Letters (2 papers)International Journal of Materials Research (formerly Zeitschrift fuer Metallkunde) (2 papers)
- Partner nations
- IsraelUnited StatesRussia
In The Last Decade
Evgeny E. Glickman
43 papers receiving 552 citations
Peers
Comparison fields: 5 of 45
- Metals and Alloys 35
- Electronic, Optical and Magnetic Materials 239
- Electrical and Electronic Engineering 286
- Materials Chemistry 200
- Mechanics of Materials 100
Countries citing papers authored by Evgeny E. Glickman
This map shows the geographic impact of Evgeny E. Glickman's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Evgeny E. Glickman with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Evgeny E. Glickman more than expected).
Fields of papers citing papers by Evgeny E. Glickman
This network shows the impact of papers produced by Evgeny E. Glickman. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Evgeny E. Glickman. The network helps show where Evgeny E. Glickman may publish in the future.
Co-authors
The 25 scholars most cited alongside Evgeny E. Glickman, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 43 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 1999 | 65 | |
| 2 | 1996 | 61 | |
| 3 | 1995 | 43 | |
| 4 | 2010 | 36 | |
| 5 | 2007 | 36 | |
| 6 | 2010 | 33 | |
| 7 | 2003 | 32 | |
| 8 | 2009 | 32 | |
| 9 | 1995 | 26 | |
| 10 | 1994 | 21 | |
| 11 | 2003 | 18 | |
| 12 | 2009 | 18 | |
| 13 | 2000 | 17 | |
| 14 | 1998 | 16 | |
| 15 | 2000 | 16 | |
| 16 | 2005 | 13 | |
| 17 | 2001 | 12 | |
| 18 | 2004 | 12 | |
| 19 | 1996 | 10 | |
| 20 | 2007 | 8 |
About Evgeny E. Glickman
Evgeny E. Glickman is a scholar working on Electronic, Optical and Magnetic Materials, Electrical and Electronic Engineering, Mechanics of Materials, Atomic and Molecular Physics, and Optics and Materials Chemistry, having authored 43 papers that have together received 585 indexed citations. Recurring topics across this work include Copper Interconnects and Reliability (31 papers), Electronic Packaging and Soldering Technologies (16 papers), Metal and Thin Film Mechanics (11 papers), Microstructure and mechanical properties (8 papers), Electrodeposition and Electroless Coatings (6 papers), Semiconductor materials and devices (6 papers), Surface and Thin Film Phenomena (5 papers) and Semiconductor materials and interfaces (5 papers). The work is most often cited by research in Metals and Alloys (35 citations), Electronic, Optical and Magnetic Materials (239 citations), Electrical and Electronic Engineering (286 citations), Materials Chemistry (200 citations) and Mechanics of Materials (100 citations). Evgeny E. Glickman has collaborated with scholars based in Israel, United States and Russia. Frequent co-authors include Menachem Nathan, Alexandra Inberg, Nick Fishelson, Yosi Shacham‐Diamand, Leonid M. Klinger, Noam Eliaz, Yossi Lereah, Alexander Gladkikh, A. Palevski and Nathan I. Croitoru. Their work appears in journals such as Defect and diffusion forum/Diffusion and defect data, solid state data. Part A, Defect and diffusion forum, Microelectronic Engineering, Journal of Applied Physics, Applied Physics Letters and International Journal of Materials Research (formerly Zeitschrift fuer Metallkunde).
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.