Eric Pek

791 citations
9 papers · 666 · h-index 7

Impact in

    • Electronic Packaging and Soldering Technologies
    • 3D IC and TSV technologies
    • Electrostatic Discharge in Electronics
    • Integrated Circuits and Semiconductor Failure Analysis
    • Electromagnetic Compatibility and Noise Suppression
    • Material Properties and Processing

Papers in

Eric Pek

9 papers receiving 614 citations

Peers

Eric Pek
Comparison fields: 5 of 26
  • Electrical and Electronic Engineering 624
  • Mechanics of Materials 232
  • Mechanical Engineering 99
  • Hardware and Architecture 16
  • Civil and Structural Engineering 39
Replace Jing-en Luan with:
Jing-en Luan Singapore
Hun Shen Ng Singapore
Scott Irving United States
Nokibul Islam United States
Sueo KAWAI Japan
Yi-Hsin Pao United States
Chao-Pin Yeh United States
Sandeep Shantaram United States
Jiefeng Xu United States
Anthony A. Primavera United States
Eric Pek relative to Jing-en Luan Singapore Jing-en Luan's profile →
Citations per field
00.5×1.5×
Jing-en Luan · 1×
Citations per year

Countries citing papers authored by Eric Pek

Since Specialization
Citations

This map shows the geographic impact of Eric Pek's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Eric Pek with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Eric Pek more than expected).

Fields of papers citing papers by Eric Pek

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Eric Pek. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Eric Pek. The network helps show where Eric Pek may publish in the future.

Co-authors

The 7 scholars most cited alongside Eric Pek, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Eric Pek Line = papers co-authored together Eric Pek links everyone, so they are left out of the graph.

All Works

9 of 9 papers shown
#Work
1 2004163
2 2004137
3 2004101
4 200482
5 200477
6 200663
7 200734
8 20065
9 20064

About Eric Pek

Eric Pek is a scholar working on Electrical and Electronic Engineering, Mechanics of Materials, Insect Science, Renewable Energy, Sustainability and the Environment and Obstetrics and Gynecology, having authored 9 papers that have together received 666 indexed citations. Recurring topics across this work include 3D IC and TSV technologies (9 papers), Electronic Packaging and Soldering Technologies (9 papers), Electrostatic Discharge in Electronics (7 papers) and Material Properties and Processing (2 papers). The work is most often cited by research in Electrical and Electronic Engineering (624 citations), Mechanics of Materials (232 citations), Mechanical Engineering (99 citations), Hardware and Architecture (16 citations) and Civil and Structural Engineering (39 citations). Eric Pek has collaborated with scholars based in Singapore, United States and Switzerland. Frequent co-authors include Chwee Teck Lim, Tong Yan Tee, Z.W. Zhong, Jing-en Luan, Hun Shen Ng, Jiang Zhou and V.B.C. Tan. Their work appears in journals such as Microelectronics Reliability, IEEE Transactions on Components and Packaging Technologies and National University of Singapore.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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