Eric Lindbloom
Impact in
- Hardware and Architecture top 0.5%
- VLSI and Analog Circuit Testing
- Physical Unclonable Functions (PUFs) and Hardware Security
-
- Integrated Circuits and Semiconductor Failure Analysis
- Radiation Effects in Electronics
- VLSI and FPGA Design Techniques
- Low-power high-performance VLSI design
Papers in
-
- VLSI and Analog Circuit Testing 7
- Physical Unclonable Functions (PUFs) and Hardware Security 3
- Software 3
- Software Testing and Debugging Techniques 3
- Co-authors
- John A. Waicukauski (7 shared papers)E. B. Eichelberger (5 shared papers)Barry K. Rosen (2 shared papers)Vijay Iyengar (1 shared paper)Vijay S. Iyengar (1 shared paper)Tim McCarthy (1 shared paper)
- Journals
- IBM Journal of Research and Development (3 papers)IEEE Transactions on Computers (1 paper)Microelectronics Reliability (1 paper)IEEE Design & Test of Computers (2 papers)International Test Conference (3 papers)
- Partner nations
- United StatesHungaryUnited Kingdom
In The Last Decade
Eric Lindbloom
11 papers receiving 1.1k citations
Peers
Comparison fields: 5 of 21
- Hardware and Architecture 1.2k
- Electrical and Electronic Engineering 1.1k
- Software 68
- Control and Systems Engineering 164
- Industrial and Manufacturing Engineering 21
Countries citing papers authored by Eric Lindbloom
This map shows the geographic impact of Eric Lindbloom's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Eric Lindbloom with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Eric Lindbloom more than expected).
Fields of papers citing papers by Eric Lindbloom
This network shows the impact of papers produced by Eric Lindbloom. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Eric Lindbloom. The network helps show where Eric Lindbloom may publish in the future.
Co-authors
The 6 scholars most cited alongside Eric Lindbloom, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1987 | 319 | |
| 2 | 1989 | 234 | |
| 3 | 1983 | 156 | |
| 4 | 1975 | 147 | |
| 5 | 1989 | 141 | |
| 6 | Transition Fault Simulation by Parallel Pattern Single Fault Propagation. | 1986 | 85 |
| 7 | A Statistical Calculation of Fault Detection Probabilities By Fast Fault Simulation. | 1985 | 35 |
| 8 | 1980 | 32 | |
| 9 | 2003 | 18 | |
| 10 | An LSSD Pseudo Random Pattern Test System. | 1983 | 10 |
| 11 | 1989 | 4 |
About Eric Lindbloom
Eric Lindbloom is a scholar working on Hardware and Architecture, Software, Electrical and Electronic Engineering, Computer Networks and Communications and Control and Systems Engineering, having authored 11 papers that have together received 1.2k indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (7 papers), Integrated Circuits and Semiconductor Failure Analysis (6 papers), Physical Unclonable Functions (PUFs) and Hardware Security (3 papers), Software Testing and Debugging Techniques (3 papers), Radiation Effects in Electronics (2 papers), Software System Performance and Reliability (2 papers), Distributed and Parallel Computing Systems (1 paper) and VLSI and FPGA Design Techniques (1 paper). The work is most often cited by research in Hardware and Architecture (1.2k citations), Electrical and Electronic Engineering (1.1k citations), Software (68 citations), Control and Systems Engineering (164 citations) and Industrial and Manufacturing Engineering (21 citations). Eric Lindbloom has collaborated with scholars based in United States, Hungary and United Kingdom. Frequent co-authors include John A. Waicukauski, E. B. Eichelberger, Barry K. Rosen, Vijay Iyengar, Vijay S. Iyengar and Tim McCarthy. Their work appears in journals such as IBM Journal of Research and Development, IEEE Transactions on Computers, Microelectronics Reliability, IEEE Design & Test of Computers and International Test Conference.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.