E. Young
Impact in
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- Industrial Vision Systems and Defect Detection
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- Image Processing Techniques and Applications
Papers in
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- Radio Frequency Integrated Circuit Design 1
- CCD and CMOS Imaging Sensors 1
- Co-authors
- Bryan Julien (1 shared paper)Richard Calendar (1 shared paper)Hugh Simon Lam (1 shared paper)J. F. Arens (1 shared paper)Johannes Hubmayr (1 shared paper)F. J. Low (1 shared paper)Zeeshan Ahmed (1 shared paper)Maximiliano Silva-Feaver (1 shared paper)
- Journals
- Journal of Bacteriology (1 paper)Journal of Low Temperature Physics (1 paper)Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE (1 paper)Bulletin of the American Astronomical Society (1 paper)
- Partner nations
- United StatesUnited Kingdom
In The Last Decade
E. Young
5 papers receiving 21 citations
Peers
Comparison fields: 5 of 20
- Industrial and Manufacturing Engineering 11
- Media Technology 8
- Computer Vision and Pattern Recognition 8
- Toxicology 1
- Instrumentation 1
Countries citing papers authored by E. Young
This map shows the geographic impact of E. Young's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by E. Young with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites E. Young more than expected).
Fields of papers citing papers by E. Young
This network shows the impact of papers produced by E. Young. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by E. Young. The network helps show where E. Young may publish in the future.
Co-authors
The 25 scholars most cited alongside E. Young, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1995 | 12 | |
| 2 | 1998 | 5 | |
| 3 | 1995 | 3 | |
| 4 | Multiband Imaging Photometer for SIRTF | 1984 | 1 |
| 5 | 2022 | 1 |
About E. Young
E. Young is a scholar working on Electrical and Electronic Engineering, Molecular Biology, Astronomy and Astrophysics, Computer Vision and Pattern Recognition and Ecology, having authored 5 papers that have together received 22 indexed citations. Recurring topics across this work include Superconducting and THz Device Technology (1 paper), Radio Frequency Integrated Circuit Design (1 paper), CCD and CMOS Imaging Sensors (1 paper), Image Processing Techniques and Applications (1 paper), Embedded Systems Design Techniques (1 paper), Bacterial Genetics and Biotechnology (1 paper), Bacteriophages and microbial interactions (1 paper) and Remote Sensing and LiDAR Applications (1 paper). The work is most often cited by research in Industrial and Manufacturing Engineering (11 citations), Media Technology (8 citations), Computer Vision and Pattern Recognition (8 citations), Toxicology (1 citation) and Instrumentation (1 citation). E. Young has collaborated with scholars based in United States and United Kingdom. Frequent co-authors include Bryan Julien, Richard Calendar, Hugh Simon Lam, J. F. Arens, Johannes Hubmayr, F. J. Low, Zeeshan Ahmed, Maximiliano Silva-Feaver, Cyndia Yu and G. Neugebauer. Their work appears in journals such as Journal of Bacteriology, Journal of Low Temperature Physics, Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE and Bulletin of the American Astronomical Society.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.