E. Young
Impact in
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- Industrial Vision Systems and Defect Detection
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- Image Processing Techniques and Applications
Papers in
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- Image and Object Detection Techniques 1
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- Embedded Systems Design Techniques 1
- Journals
- Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE (1 paper)
- Partner nations
- United Kingdom
In The Last Decade
E. Young
2 papers receiving 14 citations
Peers
Comparison fields: 5 of 13
- Industrial and Manufacturing Engineering 11
- Media Technology 8
- Computer Vision and Pattern Recognition 8
- Hardware and Architecture 1
- Computational Mechanics 2
Countries citing papers authored by E. Young
This map shows the geographic impact of E. Young's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by E. Young with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites E. Young more than expected).
Fields of papers citing papers by E. Young
This network shows the impact of papers produced by E. Young. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by E. Young. The network helps show where E. Young may publish in the future.
No co-authors to show.
All Works
About E. Young
E. Young is a scholar working on Computer Vision and Pattern Recognition, Hardware and Architecture, Media Technology, Environmental Engineering and Electrical and Electronic Engineering, having authored 2 papers that have together received 15 indexed citations. Recurring topics across this work include Industrial Vision Systems and Defect Detection (1 paper), CCD and CMOS Imaging Sensors (1 paper), Embedded Systems Design Techniques (1 paper), Image Processing Techniques and Applications (1 paper), Remote Sensing and LiDAR Applications (1 paper) and Image and Object Detection Techniques (1 paper). The work is most often cited by research in Industrial and Manufacturing Engineering (11 citations), Media Technology (8 citations), Computer Vision and Pattern Recognition (8 citations), Hardware and Architecture (1 citation) and Computational Mechanics (2 citations). E. Young has collaborated with scholars based in United Kingdom. Their work appears in journals such as Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.