E. Trischler
Impact in
- Hardware and Architecture top 2%
- VLSI and Analog Circuit Testing
- Software top 10%
- Software Testing and Debugging Techniques
Papers in
-
- VLSI and Analog Circuit Testing 10
-
- Integrated Circuits and Semiconductor Failure Analysis 9
- Low-power high-performance VLSI design 1
- VLSI and FPGA Design Techniques 1
- Radiation Effects in Electronics 1
- Co-authors
- Michael Schulz (3 shared papers)Mats I. Johansson (1 shared paper)A.P. Ambler (2 shared papers)
- Journals
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (2 papers)Journal of Electronic Testing (2 papers)Design Automation Conference (1 paper)IEEE Design & Test of Computers (1 paper)International Test Conference (1 paper)
- Partner nations
- GermanyUnited StatesUnited Kingdom
In The Last Decade
E. Trischler
9 papers receiving 422 citations
Peers
Comparison fields: 5 of 23
- Hardware and Architecture 433
- Software 48
- Electrical and Electronic Engineering 410
- Computational Theory and Mathematics 40
- Control and Systems Engineering 37
Countries citing papers authored by E. Trischler
This map shows the geographic impact of E. Trischler's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by E. Trischler with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites E. Trischler more than expected).
Fields of papers citing papers by E. Trischler
This network shows the impact of papers produced by E. Trischler. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by E. Trischler. The network helps show where E. Trischler may publish in the future.
Co-authors
The 3 scholars most cited alongside E. Trischler, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1988 | 417 | |
| 2 | ATWIG, an automatic test pattern generator with inherent guidance | 1984 | 8 |
| 3 | 1992 | 7 | |
| 4 | 1984 | 5 | |
| 5 | 1994 | 5 | |
| 6 | 2003 | 4 | |
| 7 | 1994 | 3 | |
| 8 | 1984 | 2 | |
| 9 | DOM: a defect occurrence model for evaluating the life cycle costs of test strategies | 1992 | 1 |
| 10 | 1995 | 0 | |
| 11 | 2003 | 0 |
About E. Trischler
E. Trischler is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering, Control and Systems Engineering, Software and Industrial and Manufacturing Engineering, having authored 11 papers that have together received 452 indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (10 papers), Integrated Circuits and Semiconductor Failure Analysis (9 papers), Engineering and Test Systems (5 papers), Software Testing and Debugging Techniques (2 papers), Low-power high-performance VLSI design (1 paper), Industrial Vision Systems and Defect Detection (1 paper), VLSI and FPGA Design Techniques (1 paper) and Radiation Effects in Electronics (1 paper). The work is most often cited by research in Hardware and Architecture (433 citations), Software (48 citations), Electrical and Electronic Engineering (410 citations), Computational Theory and Mathematics (40 citations) and Control and Systems Engineering (37 citations). E. Trischler has collaborated with scholars based in Germany, United States and United Kingdom. Frequent co-authors include Michael Schulz, Mats I. Johansson and A.P. Ambler. Their work appears in journals such as IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Journal of Electronic Testing, Design Automation Conference, IEEE Design & Test of Computers and International Test Conference.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.