Don Williams

408 citations
43 papers · 289 · h-index 10

Impact in

Papers in

Don Williams

40 papers receiving 204 citations

Peers

Don Williams
Comparison fields: 5 of 69
  • Computer Vision and Pattern Recognition 143
  • Media Technology 48
  • Geology 29
  • Industrial and Manufacturing Engineering 37
  • Aerospace Engineering 88
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Alan Chalmers United Kingdom
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Citations per field
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Citations per year

Countries citing papers authored by Don Williams

Since Specialization
Citations

This map shows the geographic impact of Don Williams's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Don Williams with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Don Williams more than expected).

Fields of papers citing papers by Don Williams

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Don Williams. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Don Williams. The network helps show where Don Williams may publish in the future.

Co-authors

The 12 scholars most cited alongside Don Williams, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Don Williams Line = papers co-authored together Don Williams links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 43 papers — load more, or switch the sort, to bring in the rest.

#Work
1
Benchmarking of the ISO 12233 Slanted-edge Spatial Frequency Response Plug-in.
199828
2
Refined Slanted-Edge Measurement from Practical Camera and Scanner Testing.
200224
3 200320
4
Using Slanted Edge Analysis for Color Registration Measurement
199918
5 201418
6
Diagnostics for Digital Capture using MTF
200117
7 200315
8 201815
9 200712
10 200411
11 20069
12 20079
13 20099
14 20128
15 20076
16 20076
17 20085
18 20105
19
Distilling Noise Sources for Digital Capture Devices
20014
20 20204

About Don Williams

Don Williams is a scholar working on Computer Vision and Pattern Recognition, Media Technology, Industrial and Manufacturing Engineering, Atomic and Molecular Physics, and Optics and Aerospace Engineering, having authored 43 papers that have together received 289 indexed citations. Recurring topics across this work include Industrial Vision Systems and Defect Detection (9 papers), Image Processing Techniques and Applications (8 papers), Optical measurement and interference techniques (8 papers), Color Science and Applications (8 papers), Infrared Target Detection Methodologies (7 papers), 3D Surveying and Cultural Heritage (6 papers), Digital Radiography and Breast Imaging (4 papers) and Image and Signal Denoising Methods (4 papers). The work is most often cited by research in Computer Vision and Pattern Recognition (143 citations), Media Technology (48 citations), Geology (29 citations), Industrial and Manufacturing Engineering (37 citations) and Aerospace Engineering (88 citations). Don Williams has collaborated with scholars based in United States, United Kingdom and Singapore. Frequent co-authors include Peter D. Burns, Gavin Kelly, Paul M. Hubel, Andrew Cordle, Edul N. Dalal, Daniel Rasmussen, Carol L. Andrews, John L. Griffith, Roger B. Marks and Steven Semken. Their work appears in journals such as Food technology, Seminars in Musculoskeletal Radiology, Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE, Electronic Imaging and Archiving Conference.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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