D.M. Lowe

11 papers receiving 469 citations

Peers

D.M. Lowe
Comparison fields: 5 of 55
  • Catalysis 141
  • Surfaces, Coatings and Films 79
  • Materials Chemistry 262
  • Conservation 13
  • Electrical and Electronic Engineering 170
Replace L. C. A. van den Oetelaar with:
L. C. A. van den Oetelaar Netherlands
J.-L. Vignes France
I.G. Stara Czechia
J.G. Chen United States
M. M. Guraya Argentina
A. David Logan United States
J.W.A. Sachtler United States
Andreas Klust United States
Jonathan D. P. Counsell United Kingdom
F.P. Leisenberger Austria
D.M. Lowe relative to L. C. A. van den Oetelaar Netherlands L. C. A. van den Oetelaar's profile →
Citations per field
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L. C. A. van den Oetelaar · 1×
Citations per year

Countries citing papers authored by D.M. Lowe

Since Specialization
Citations

This map shows the geographic impact of D.M. Lowe's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D.M. Lowe with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D.M. Lowe more than expected).

Fields of papers citing papers by D.M. Lowe

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by D.M. Lowe. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D.M. Lowe. The network helps show where D.M. Lowe may publish in the future.

Co-authors

The 24 scholars most cited alongside D.M. Lowe, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with D.M. Lowe Line = papers co-authored together D.M. Lowe links everyone, so they are left out of the graph.

All Works

11 of 11 papers shown
#Work
1 1978137
2 1999103
3 199785
4 200252
5 201248
6 200334
7 199612
8 197911
9
Thermal response of rigid and flexible insulations and reflective coating in an aeroconvective heating environment
19924
10 19972
11 19971

About D.M. Lowe

D.M. Lowe is a scholar working on Materials Chemistry, Electrical and Electronic Engineering, Catalysis, Mechanics of Materials and Aerospace Engineering, having authored 11 papers that have together received 489 indexed citations. Recurring topics across this work include Catalytic Processes in Materials Science (4 papers), Catalysis and Oxidation Reactions (3 papers), Metal and Thin Film Mechanics (2 papers), Electrocatalysts for Energy Conversion (2 papers), Advancements in Solid Oxide Fuel Cells (2 papers), Powdery Mildew Fungal Diseases (1 paper), High-Temperature Coating Behaviors (1 paper) and Gyrotron and Vacuum Electronics Research (1 paper). The work is most often cited by research in Catalysis (141 citations), Surfaces, Coatings and Films (79 citations), Materials Chemistry (262 citations), Conservation (13 citations) and Electrical and Electronic Engineering (170 citations). D.M. Lowe has collaborated with scholars based in United States, Germany and Canada. Frequent co-authors include J. A. Dobrowolski, J.G. McCarty, Michael Gusman, D. L. Hildenbrand, P.V.V. Jayaweera, Nan Jiang, Eric D. Wachsman, Bruce G. Pound, Philip F. Taday and Matija Strlič. Their work appears in journals such as Catalysis Today, Surface and Coatings Technology, Analytical and Bioanalytical Chemistry, The Canadian Journal of Chemical Engineering and Applied Catalysis A General.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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