C.-Y. Lu

1.1k citations

60 papers · 713 · h-index 15

Impact in

Electrical and Electronic Engineering top 5%
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Advanced Memory and Neural Computing
- Integrated Circuits and Semiconductor Failure Analysis
- Ferroelectric and Negative Capacitance Devices
- Silicon and Solar Cell Technologies
- Thin-Film Transistor Technologies
Atomic and Molecular Physics, and Optics
- Semiconductor materials and interfaces

Papers in

Electrical and Electronic Engineering 56
- Semiconductor materials and devices 42
- Advancements in Semiconductor Devices and Circuit Design 29
- Advanced Memory and Neural Computing 17
- Integrated Circuits and Semiconductor Failure Analysis 15
- Thin-Film Transistor Technologies 8
- Silicon and Solar Cell Technologies 7
- Ferroelectric and Negative Capacitance Devices 6
- Silicon Carbide Semiconductor Technologies 5
Materials Chemistry 7

Co-authors: J.M. Sung (7 shared papers)N. S. Tsai (9 shared papers)S.J. Hillenius (4 shared papers)H.C. Kirsch (3 shared papers)Tien‐Chang Lu (5 shared papers)Yao‐Wen Chang (4 shared papers)T. E. Smith (2 shared papers)L. Manchanda (2 shared papers)
Journals: IEEE Electron Device Letters (15 papers)IEEE Transactions on Electron Devices (10 papers)Solid-State Electronics (3 papers)Journal of The Electrochemical Society (3 papers)Electronics Letters (1 paper)
Partner nations: Taiwan United States Germany

In The Last Decade

C.-Y. Lu

57 papers receiving 674 citations

Peers

Countries citing papers authored by C.-Y. Lu

Since Specialization

Citations

This map shows the geographic impact of C.-Y. Lu's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C.-Y. Lu with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C.-Y. Lu more than expected).

Fields of papers citing papers by C.-Y. Lu

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by C.-Y. Lu. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C.-Y. Lu. The network helps show where C.-Y. Lu may publish in the future.

Co-authors

The 25 scholars most cited alongside C.-Y. Lu, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with C.-Y. Lu Line = papers co-authored together C.-Y. Lu links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

Showing the 20 most-cited of 60 papers — load more, or switch the sort, to bring in the rest.

#	Work
1	Reverse short-channel effects on threshold voltage in submicrometer salicide devices IEEE Electron Device Letters ·C.-Y. Lu, J.M. Sung	1989	62
2	Anomalous C-V characteristics of implanted poly MOS structure in n/sup +//p/sup +/ dual-gate CMOS technology IEEE Electron Device Letters ·C.-Y. Lu, J.M. Sung, H.C. Kirsch, S.J. Hillenius, T. E. Smith, L. Manchanda	1989	62
3	Explosion of poly-silicide links in laser programmable redundancy for VLSI memory repair IEEE Transactions on Electron Devices ·C.-Y. Lu, J.D. Chlipala, Leonard M. Scarfone	1989	61
4	A Highly Reliable Self-Aligned Graded Oxide WO<inf>x</inf> Resistance Memory: Conduction Mechanisms and Reliability ChiaHua Ho, Erh-Kun Lai, M. D. Lee, Chen-Ling Pan, Y. D. Yao, K. Y. Hsieh, Rich Liu, C.-Y. Lu	2007	49
5	Process limitation and device design tradeoffs of self-aligned TiSi/sub 2/ junction formation in submicrometer CMOS devices IEEE Transactions on Electron Devices ·C.-Y. Lu, J.J. Sung, R. Liu, N. S. Tsai, R. Sing, S.J. Hillenius, H.C. Kirsch	1991	48
6	A comprehensive study on p/sup +/ polysilicon-gate MOSFET's instability with fluorine incorporation IEEE Transactions on Electron Devices ·J.J. Sung, C.-Y. Lu	1990	43
7	Reliability models of data retention and read-disturb in 2-bit nitride storage flash memory cells T. Wang, Wen-Jer Tsai, S.H. Gu, C.T. Chan, Chi‐Ju Yeh, N. K. Zous, Tien‐Chang Lu, S. Pan, C.-Y. Lu	2004	34
8	Modeling for the 2nd-Bit Effect of a Nitride-Based Trapping Storage Flash EEPROM Cell Under Two-Bit Operation IEEE Electron Device Letters ·Yao‐Wen Chang, Tien‐Chang Lu, S. Pan, C.-Y. Lu	2004	26
9	A Highly Stackable Thin-Film Transistor (TFT) NAND-Type Flash Memory Erh-Kun Lai, Hang-Ting Lue, Yi‐Hsuan Hsiao, Jian‐Yu Hsieh, Si‐Chen Lee, Chia-Hui Lu, S.-Y. Wang, Ling Yang, K.-C. Chen, Jiangdong Gong, K. Y. Hsieh, J. Ku, R. Liu, C.-Y. Lu	2006	22
10	A Novel Simple CBCM Method Free From Charge Injection-Induced Errors IEEE Electron Device Letters ·Yao‐Wen Chang, Hsuan‐Chun Chang, C.H. Hsieh, H.C. Lai, Tsung‐Chien Lu, W. Ting, J. Ku, C.-Y. Lu	2004	21
11	An analog/digital BCDMOS technology with dielectric isolation-devices and processes IEEE Transactions on Electron Devices ·C.-Y. Lu, N. S. Tsai, Christopher N. Dunn, P.C. Riffe, M.A. Shibib, R.A. Furnanage, C.A. Goodwin	1988	19
12	High-performance salicide shallow-junction CMOS devices for submicrometer VLSI application in twin-tub VI IEEE Transactions on Electron Devices ·C.-Y. Lu, J.J. Sung, H.C. Kirsch, N. S. Tsai, R. Liu, A.S. Manocha, S.J. Hillenius	1989	19
13	Positive Oxide Charge-Enhanced Read Disturb in a Localized Trapping Storage Flash Memory Cell IEEE Transactions on Electron Devices ·Wen-Jer Tsai, Chi‐Ju Yeh, N. K. Zous, C.C. Liu, S.K. Cho, T. Wang, S. Pan, C.-Y. Lu	2004	15
14	Lateral Migration of Trapped Holes in a Nitride Storage Flash Memory Cell and Its Qualification Methodology IEEE Electron Device Letters ·N. K. Zous, M.Y. Lee, Wen-Jer Tsai, Albert Kuo, L.T. Huang, Tsung‐Chien Lu, C.J. Liu, T. Wang, Wei Lü, W. Ting, J. Ku, C.-Y. Lu	2004	15
15	Interconnect Capacitance Characterization Using Charge-Injection-Induced Error-Free (CIEF) Charge-Based Capacitance Measurement (CBCM) IEEE Transactions on Semiconductor Manufacturing ·Yao‐Wen Chang, Hsuan‐Chun Chang, Tien‐Chang Lu, Ya‐Chin King, W. Ting, Y.-H.J. Ku, C.-Y. Lu	2006	14
16	Investigation of Maximum Current Sensing Window for Two-Side Operation, Four-bit/cell MLC Nitride-Trapping Nonvolatile Flash Memories IEEE Electron Device Letters ·T.H. Hsu, M.-H. Lee, J. Y. Wu, H.L. Lung, R. Liu, C.-Y. Lu	2004	10
17	Limitation of spacer thickness in titanium salicide ULSI CMOS technology IEEE Electron Device Letters ·Lee Jae Sung, C.-Y. Lu	1989	10
18	Corrections to "A new conduction model for polycrystalline silicon films" IEEE Electron Device Letters ·Nicky Lu, L. Gerzberg, C.-Y. Lu, J.D. Meindl	1981	10
19	Device Instability of ReRAM and a Novel Reference Cell Design for Wide Temperature Range Operation IEEE Electron Device Letters ·Yu‐Hsuan Lin, Yu‐Yu Lin, Feng-Ming Lee, Yung-Han Ho, K.C. Hsu, M. H. Lee, D. Y. Lee, Kuang-Hao Chiang, C. C. Yang, C. H. Li, Syue-Ren Wu, Chuanzhen Lei, C. M. Lin, C. J. Chen, Kuei‐Hsien Chen, H.L. Lung, K. C. Wang, Tseung‐Yuen Tseng, C.-Y. Lu	2017	10
20	Semiconducting chalcogenide buffer layer for oxide heteroepitaxy on Si(001) Applied Physics Letters ·Diedrich A. Schmidt, Taisuke Ohta, C.-Y. Lu, Aaron Bostwick, Qiuming Yu, Eli Rotenberg, Fumio S. Ohuchi, Marjorie A. Olmstead	2006	9

About C.-Y. Lu

C.-Y. Lu is a scholar working on Electrical and Electronic Engineering, Materials Chemistry, Atomic and Molecular Physics, and Optics, Computer Networks and Communications and Biomedical Engineering, having authored 60 papers that have together received 713 indexed citations. Recurring topics across this work include Semiconductor materials and devices (42 papers), Advancements in Semiconductor Devices and Circuit Design (29 papers), Advanced Memory and Neural Computing (17 papers), Integrated Circuits and Semiconductor Failure Analysis (15 papers), Thin-Film Transistor Technologies (8 papers), Silicon and Solar Cell Technologies (7 papers), Ferroelectric and Negative Capacitance Devices (6 papers) and Silicon Carbide Semiconductor Technologies (5 papers). The work is most often cited by research in Electrical and Electronic Engineering (683 citations), Atomic and Molecular Physics, and Optics (127 citations), Hardware and Architecture (23 citations), Materials Chemistry (110 citations) and Biomedical Engineering (59 citations). C.-Y. Lu has collaborated with scholars based in Taiwan, United States and Germany. Frequent co-authors include J.M. Sung, N. S. Tsai, S.J. Hillenius, H.C. Kirsch, Tien‐Chang Lu, Yao‐Wen Chang, T. E. Smith, L. Manchanda, N. K. Zous and K. Y. Hsieh. Their work appears in journals such as IEEE Electron Device Letters, IEEE Transactions on Electron Devices, Solid-State Electronics, Journal of The Electrochemical Society and Electronics Letters.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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