C.Y. Li
Impact in
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- Copper Interconnects and Reliability
Papers in
-
- Semiconductor materials and devices 13
- Electrodeposition and Electroless Coatings 2
- Electronic Packaging and Soldering Technologies 2
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- Copper Interconnects and Reliability 13
- Co-authors
- Deborah A. Kallick (1 shared paper)Charles R. Watts (1 shared paper)D.H. Zhang (8 shared papers)P.D. Foo (6 shared papers)Guoqiang You (1 shared paper)Manwen Yao (3 shared papers)Xi Yao (3 shared papers)Liping Yang (3 shared papers)
- Journals
- Thin Solid Films (7 papers)Electronics Letters (2 papers)Journal of Magnetic Resonance Series B (1 paper)Journal of Crystal Growth (1 paper)Materials & Design (1 paper)
- Partner nations
- SingaporeChinaUnited States
In The Last Decade
C.Y. Li
19 papers receiving 336 citations
Peers
Comparison fields: 5 of 63
- Electronic, Optical and Magnetic Materials 124
- Microbiology 22
- Electrical and Electronic Engineering 140
- Mechanics of Materials 53
- Spectroscopy 34
Countries citing papers authored by C.Y. Li
This map shows the geographic impact of C.Y. Li's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C.Y. Li with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C.Y. Li more than expected).
Fields of papers citing papers by C.Y. Li
This network shows the impact of papers produced by C.Y. Li. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C.Y. Li. The network helps show where C.Y. Li may publish in the future.
Co-authors
The 25 scholars most cited alongside C.Y. Li, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1995 | 130 | |
| 2 | 2015 | 33 | |
| 3 | 2004 | 33 | |
| 4 | 2002 | 32 | |
| 5 | 2004 | 32 | |
| 6 | 2004 | 19 | |
| 7 | 2023 | 18 | |
| 8 | 2003 | 14 | |
| 9 | 2004 | 8 | |
| 10 | 2024 | 5 | |
| 11 | 2002 | 5 | |
| 12 | 2001 | 3 | |
| 13 | 2004 | 2 | |
| 14 | 2004 | 2 | |
| 15 | 2001 | 2 | |
| 16 | 2025 | 1 | |
| 17 | 1996 | 1 | |
| 18 | 2004 | 1 | |
| 19 | 2004 | 1 | |
| 20 | 2004 | 0 |
About C.Y. Li
C.Y. Li is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Materials Chemistry, Mechanics of Materials and Atomic and Molecular Physics, and Optics, having authored 20 papers that have together received 342 indexed citations. Recurring topics across this work include Copper Interconnects and Reliability (13 papers), Semiconductor materials and devices (13 papers), Ferroelectric and Piezoelectric Materials (3 papers), Metal and Thin Film Mechanics (2 papers), Electrodeposition and Electroless Coatings (2 papers), Dielectric materials and actuators (2 papers), Electronic Packaging and Soldering Technologies (2 papers) and Microstructure and mechanical properties (2 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (124 citations), Microbiology (22 citations), Electrical and Electronic Engineering (140 citations), Mechanics of Materials (53 citations) and Spectroscopy (34 citations). C.Y. Li has collaborated with scholars based in Singapore, China and United States. Frequent co-authors include Deborah A. Kallick, Charles R. Watts, D.H. Zhang, P.D. Foo, Guoqiang You, Manwen Yao, Xi Yao, Liping Yang, Andrew T. S. Wee and X.P. Zhang. Their work appears in journals such as Thin Solid Films, Electronics Letters, Journal of Magnetic Resonance Series B, Journal of Crystal Growth and Materials & Design.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.