Chandan Bhat
Impact in
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- Electronic Packaging and Soldering Technologies
- Integrated Circuits and Semiconductor Failure Analysis
- Microwave Engineering and Waveguides
Papers in
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- Electronic Packaging and Soldering Technologies 9
- Integrated Circuits and Semiconductor Failure Analysis 7
- Microwave Engineering and Waveguides 2
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- Geophysical Methods and Applications 5
- Co-authors
- Pradeep Lall (8 shared papers)Jeff Suhling (4 shared papers)Jay K. Lee (4 shared papers)Uday K. Khankhoje (8 shared papers)Emir Ali Karahan (2 shared papers)Kaushik Sengupta (2 shared papers)Nokibul Islam (2 shared papers)Kai Goebel (2 shared papers)
- Journals
- Microelectronics Reliability (2 papers)Journal of the Optical Society of America A (1 paper)IEEE Transactions on Geoscience and Remote Sensing (1 paper)IEEE Transactions on Computational Imaging (1 paper)IEEE Transactions on Components Packaging and Manufacturing Technology (1 paper)
- Partner nations
- United StatesIndiaItaly
In The Last Decade
Chandan Bhat
18 papers receiving 321 citations
Peers
Comparison fields: 5 of 49
- Electrical and Electronic Engineering 206
- Statistics, Probability and Uncertainty 23
- Civil and Structural Engineering 64
- Industrial and Manufacturing Engineering 26
- Molecular Medicine 11
Countries citing papers authored by Chandan Bhat
This map shows the geographic impact of Chandan Bhat's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Chandan Bhat with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Chandan Bhat more than expected).
Fields of papers citing papers by Chandan Bhat
This network shows the impact of papers produced by Chandan Bhat. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Chandan Bhat. The network helps show where Chandan Bhat may publish in the future.
Co-authors
The 14 scholars most cited alongside Chandan Bhat, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2023 | 67 | |
| 2 | 2007 | 46 | |
| 3 | 2007 | 44 | |
| 4 | 2008 | 37 | |
| 5 | 2008 | 36 | |
| 6 | 2016 | 33 | |
| 7 | 2006 | 20 | |
| 8 | 2010 | 18 | |
| 9 | 2011 | 14 | |
| 10 | 2023 | 5 | |
| 11 | 2022 | 3 | |
| 12 | 2020 | 3 | |
| 13 | 2009 | 3 | |
| 14 | 2017 | 1 | |
| 15 | 2018 | 1 | |
| 16 | 2021 | 1 | |
| 17 | 2019 | 1 | |
| 18 | 2023 | 1 | |
| 19 | 2022 | 0 |
About Chandan Bhat
Chandan Bhat is a scholar working on Electrical and Electronic Engineering, Ocean Engineering, Statistics, Probability and Uncertainty, Biomedical Engineering and Aerospace Engineering, having authored 19 papers that have together received 334 indexed citations. Recurring topics across this work include Electronic Packaging and Soldering Technologies (9 papers), Microwave Imaging and Scattering Analysis (7 papers), Integrated Circuits and Semiconductor Failure Analysis (7 papers), Geophysical Methods and Applications (5 papers), Probabilistic and Robust Engineering Design (3 papers), Sparse and Compressive Sensing Techniques (3 papers), Microwave Engineering and Waveguides (2 papers) and Antenna Design and Analysis (2 papers). The work is most often cited by research in Electrical and Electronic Engineering (206 citations), Statistics, Probability and Uncertainty (23 citations), Civil and Structural Engineering (64 citations), Industrial and Manufacturing Engineering (26 citations) and Molecular Medicine (11 citations). Chandan Bhat has collaborated with scholars based in United States, India and Italy. Frequent co-authors include Pradeep Lall, Jeff Suhling, Jay K. Lee, Uday K. Khankhoje, Emir Ali Karahan, Kaushik Sengupta, Nokibul Islam, Kai Goebel, R. R. N. Sailaja and Srijanani Bhaskar. Their work appears in journals such as Microelectronics Reliability, Journal of the Optical Society of America A, IEEE Transactions on Geoscience and Remote Sensing, IEEE Transactions on Computational Imaging and IEEE Transactions on Components Packaging and Manufacturing Technology.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.