C. Schönjahn
Impact in
- Structural Biology top 5%
- Advanced Electron Microscopy Techniques and Applications
- Mechanics of Materials top 5%
- Metal and Thin Film Mechanics
Papers in
-
- Metal and Thin Film Mechanics 7
-
- Semiconductor materials and devices 3
- Integrated Circuits and Semiconductor Failure Analysis 2
- Co-authors
- D.B. Lewis (5 shared papers)W.‐D. Münz (5 shared papers)C. J. Humphreys (3 shared papers)I. Petrov (4 shared papers)Arutiun P. Ehiasarian (2 shared papers)P.Eh. Hovsepian (1 shared paper)I.J. Smith (1 shared paper)R. D. Twesten (3 shared papers)
- Journals
- Journal of Vacuum Science & Technology A Vacuum Surfaces and Films (3 papers)Surface and Coatings Technology (2 papers)Applied Physics Letters (2 papers)Surface Engineering (2 papers)Journal of Applied Physics (1 paper)
- Partner nations
- United KingdomUnited StatesNetherlands
In The Last Decade
C. Schönjahn
10 papers receiving 328 citations
Peers
Comparison fields: 5 of 18
- Structural Biology 37
- Mechanics of Materials 251
- Surfaces, Coatings and Films 65
- Materials Chemistry 231
- Electrical and Electronic Engineering 142
Countries citing papers authored by C. Schönjahn
This map shows the geographic impact of C. Schönjahn's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C. Schönjahn with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C. Schönjahn more than expected).
Fields of papers citing papers by C. Schönjahn
This network shows the impact of papers produced by C. Schönjahn. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C. Schönjahn. The network helps show where C. Schönjahn may publish in the future.
Co-authors
The 19 scholars most cited alongside C. Schönjahn, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2001 | 93 | |
| 2 | 2000 | 48 | |
| 3 | 2002 | 39 | |
| 4 | 2003 | 33 | |
| 5 | 2000 | 29 | |
| 6 | 2001 | 27 | |
| 7 | 2002 | 26 | |
| 8 | 2000 | 19 | |
| 9 | 2004 | 17 | |
| 10 | 2001 | 17 |
About C. Schönjahn
C. Schönjahn is a scholar working on Mechanics of Materials, Electrical and Electronic Engineering, Materials Chemistry, Structural Biology and Surfaces, Coatings and Films, having authored 10 papers that have together received 348 indexed citations. Recurring topics across this work include Metal and Thin Film Mechanics (7 papers), Diamond and Carbon-based Materials Research (4 papers), Electron and X-Ray Spectroscopy Techniques (3 papers), Semiconductor materials and devices (3 papers), Advanced Electron Microscopy Techniques and Applications (3 papers), High-Temperature Coating Behaviors (2 papers), Integrated Circuits and Semiconductor Failure Analysis (2 papers) and Corrosion Behavior and Inhibition (1 paper). The work is most often cited by research in Structural Biology (37 citations), Mechanics of Materials (251 citations), Surfaces, Coatings and Films (65 citations), Materials Chemistry (231 citations) and Electrical and Electronic Engineering (142 citations). C. Schönjahn has collaborated with scholars based in United Kingdom, United States and Netherlands. Frequent co-authors include D.B. Lewis, W.‐D. Münz, C. J. Humphreys, I. Petrov, Arutiun P. Ehiasarian, P.Eh. Hovsepian, I.J. Smith, R. D. Twesten, L.A. Donohue and M. Glick. Their work appears in journals such as Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, Surface and Coatings Technology, Applied Physics Letters, Surface Engineering and Journal of Applied Physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.