C. Barnhart
Impact in
- Hardware and Architecture top 1%
- VLSI and Analog Circuit Testing
- Physical Unclonable Functions (PUFs) and Hardware Security
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- Integrated Circuits and Semiconductor Failure Analysis
- VLSI and FPGA Design Techniques
- Advancements in Photolithography Techniques
- Low-power high-performance VLSI design
- Radiation Effects in Electronics
Papers in
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- VLSI and Analog Circuit Testing 7
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- Integrated Circuits and Semiconductor Failure Analysis 7
- Advancements in Photolithography Techniques 1
- VLSI and FPGA Design Techniques 1
- Low-power high-performance VLSI design 1
- Co-authors
- B. Koenemann (3 shared papers)Brion Keller (3 shared papers)T.J. Snethen (1 shared paper)A Ferko (1 shared paper)David Scott (1 shared paper)Bill Eklow (3 shared papers)Kenneth P. Parker (2 shared papers)Vivek Chickermane (1 shared paper)
- Journals
- IEEE Design & Test of Computers (2 papers)
- Partner nations
- United StatesChina
In The Last Decade
C. Barnhart
6 papers receiving 623 citations
Peers
Comparison fields: 5 of 14
- Hardware and Architecture 650
- Electrical and Electronic Engineering 643
- Control and Systems Engineering 143
- Software 12
- Computer Networks and Communications 23
Countries citing papers authored by C. Barnhart
This map shows the geographic impact of C. Barnhart's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C. Barnhart with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C. Barnhart more than expected).
Fields of papers citing papers by C. Barnhart
This network shows the impact of papers produced by C. Barnhart. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C. Barnhart. The network helps show where C. Barnhart may publish in the future.
Co-authors
The 8 scholars most cited alongside C. Barnhart, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2002 | 290 | |
| 2 | 2002 | 231 | |
| 3 | 2002 | 104 | |
| 4 | 2004 | 13 | |
| 5 | 2003 | 8 | |
| 6 | 2003 | 7 | |
| 7 | 2002 | 1 |
About C. Barnhart
C. Barnhart is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering, Control and Systems Engineering, Infectious Diseases and Organic Chemistry, having authored 7 papers that have together received 654 indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (7 papers), VLSI and Analog Circuit Testing (7 papers), Engineering and Test Systems (4 papers), Advancements in Photolithography Techniques (1 paper), VLSI and FPGA Design Techniques (1 paper) and Low-power high-performance VLSI design (1 paper). The work is most often cited by research in Hardware and Architecture (650 citations), Electrical and Electronic Engineering (643 citations), Control and Systems Engineering (143 citations), Software (12 citations) and Computer Networks and Communications (23 citations). C. Barnhart has collaborated with scholars based in United States and China. Frequent co-authors include B. Koenemann, Brion Keller, T.J. Snethen, A Ferko, David Scott, Bill Eklow, Kenneth P. Parker and Vivek Chickermane. Their work appears in journals such as IEEE Design & Test of Computers.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.