Bing Long
Impact in
- Hardware and Architecture top 2%
- VLSI and Analog Circuit Testing
- Automotive Engineering top 2%
- Advanced Battery Technologies Research
Papers in
-
- Engineering and Test Systems 21
- Fault Detection and Control Systems 10
-
- Integrated Circuits and Semiconductor Failure Analysis 24
- VLSI and FPGA Design Techniques 6
- Co-authors
- Houjun Wang (21 shared papers)Shulin Tian (17 shared papers)Zhen Liu (11 shared papers)Michael Pecht (5 shared papers)Min Li (4 shared papers)Arvind Sai Sarathi Vasan (3 shared papers)Chenglin Yang (12 shared papers)Lin Jiang (1 shared paper)
- Journals
- IEEE Transactions on Instrumentation and Measurement (4 papers)International Journal of Advancements in Computing Technology (2 papers)Electronics (2 papers)Microelectronics Reliability (2 papers)Minerals Engineering (1 paper)
- Partner nations
- ChinaUnited StatesHong Kong
In The Last Decade
Bing Long
64 papers receiving 1.2k citations
Peers
Comparison fields: 5 of 70
- Hardware and Architecture 404
- Automotive Engineering 405
- Safety, Risk, Reliability and Quality 257
- Control and Systems Engineering 554
- Electrical and Electronic Engineering 752
Countries citing papers authored by Bing Long
This map shows the geographic impact of Bing Long's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Bing Long with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Bing Long more than expected).
Fields of papers citing papers by Bing Long
This network shows the impact of papers produced by Bing Long. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Bing Long. The network helps show where Bing Long may publish in the future.
Co-authors
The 25 scholars most cited alongside Bing Long, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 72 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2013 | 202 | |
| 2 | 2012 | 154 | |
| 3 | 2013 | 123 | |
| 4 | 2014 | 84 | |
| 5 | 2010 | 64 | |
| 6 | 2012 | 49 | |
| 7 | 2013 | 49 | |
| 8 | 2008 | 47 | |
| 9 | 2022 | 38 | |
| 10 | 2010 | 35 | |
| 11 | 2019 | 34 | |
| 12 | 2010 | 32 | |
| 13 | 2021 | 25 | |
| 14 | 2008 | 24 | |
| 15 | 2011 | 24 | |
| 16 | 2012 | 23 | |
| 17 | 2010 | 21 | |
| 18 | 2014 | 21 | |
| 19 | 2013 | 18 | |
| 20 | 2020 | 17 |
About Bing Long
Bing Long is a scholar working on Control and Systems Engineering, Electrical and Electronic Engineering, Hardware and Architecture, Safety, Risk, Reliability and Quality and Automotive Engineering, having authored 72 papers that have together received 1.3k indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (33 papers), Integrated Circuits and Semiconductor Failure Analysis (24 papers), Engineering and Test Systems (21 papers), Fault Detection and Control Systems (10 papers), Industrial Vision Systems and Defect Detection (7 papers), Reliability and Maintenance Optimization (7 papers), Advanced Battery Technologies Research (6 papers) and VLSI and FPGA Design Techniques (6 papers). The work is most often cited by research in Hardware and Architecture (404 citations), Automotive Engineering (405 citations), Safety, Risk, Reliability and Quality (257 citations), Control and Systems Engineering (554 citations) and Electrical and Electronic Engineering (752 citations). Bing Long has collaborated with scholars based in China, United States and Hong Kong. Frequent co-authors include Houjun Wang, Shulin Tian, Zhen Liu, Michael Pecht, Min Li, Arvind Sai Sarathi Vasan, Chenglin Yang, Lin Jiang, Jianguo Huang and Fang Chen. Their work appears in journals such as IEEE Transactions on Instrumentation and Measurement, International Journal of Advancements in Computing Technology, Electronics, Microelectronics Reliability and Minerals Engineering.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.