Bing Long
Impact in
- Hardware and Architecture top 1%
- VLSI and Analog Circuit Testing
- Automotive Engineering top 1%
- Advanced Battery Technologies Research
Papers in
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- VLSI and Analog Circuit Testing 33
-
- Engineering and Test Systems 12
- Machine Fault Diagnosis Techniques 5
- Fault Detection and Control Systems 4
- Co-authors
- Houjun Wang (21 shared papers)Shulin Tian (20 shared papers)Zhen Liu (11 shared papers)Michael Gerard Pecht (5 shared papers)Min Li (4 shared papers)Arvind Sai Sarathi Vasan (3 shared papers)Chenglin Yang (12 shared papers)Lin Jiang (1 shared paper)
- Journals
- IEEE Transactions on Instrumentation and Measurement (4 papers)Microelectronics Reliability (2 papers)Electronics (2 papers)International Journal of Advancements in Computing Technology (2 papers)Reliability Engineering & System Safety (1 paper)
- Partner nations
- ChinaUnited StatesHong Kong
In The Last Decade
Bing Long
55 papers receiving 1.2k citations
Peers
Comparison fields: 5 of 48
- Hardware and Architecture 449
- Automotive Engineering 338
- Safety, Risk, Reliability and Quality 145
- Control and Systems Engineering 339
- Artificial Intelligence 90
Countries citing papers authored by Bing Long
This map shows the geographic impact of Bing Long's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Bing Long with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Bing Long more than expected).
Fields of papers citing papers by Bing Long
This network shows the impact of papers produced by Bing Long. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Bing Long. The network helps show where Bing Long may publish in the future.
Co-authors
The 25 scholars most cited alongside Bing Long, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 62 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2013 | 208 | |
| 2 | 2012 | 156 | |
| 3 | 2013 | 124 | |
| 4 | 2014 | 84 | |
| 5 | 2010 | 64 | |
| 6 | 2013 | 49 | |
| 7 | 2012 | 47 | |
| 8 | 2008 | 45 | |
| 9 | 2022 | 43 | |
| 10 | 2010 | 35 | |
| 11 | 2010 | 34 | |
| 12 | 2019 | 34 | |
| 13 | 2008 | 26 | |
| 14 | 2021 | 25 | |
| 15 | 2011 | 24 | |
| 16 | 2012 | 23 | |
| 17 | 2010 | 21 | |
| 18 | 2014 | 21 | |
| 19 | 2013 | 18 | |
| 20 | 2020 | 17 |
About Bing Long
Bing Long is a scholar working on Hardware and Architecture, Control and Systems Engineering, Safety, Risk, Reliability and Quality, Automotive Engineering and Artificial Intelligence, having authored 62 papers that have together received 1.2k indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (33 papers), Engineering and Test Systems (12 papers), Reliability and Maintenance Optimization (8 papers), Advanced Battery Technologies Research (6 papers), Machine Fault Diagnosis Techniques (5 papers), Fault Detection and Control Systems (4 papers), Image and Signal Denoising Methods (2 papers) and Metaheuristic Optimization Algorithms Research (2 papers). The work is most often cited by research in Hardware and Architecture (449 citations), Automotive Engineering (338 citations), Safety, Risk, Reliability and Quality (145 citations), Control and Systems Engineering (339 citations) and Artificial Intelligence (90 citations). Bing Long has collaborated with scholars based in China, United States and Hong Kong. Frequent co-authors include Houjun Wang, Shulin Tian, Zhen Liu, Michael Gerard Pecht, Min Li, Arvind Sai Sarathi Vasan, Chenglin Yang, Lin Jiang, Jianguo Huang and Fang Chen. Their work appears in journals such as IEEE Transactions on Instrumentation and Measurement, Microelectronics Reliability, Electronics, International Journal of Advancements in Computing Technology and Reliability Engineering & System Safety.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.