Benoit Dufort
Impact in
- Hardware and Architecture top 5%
- VLSI and Analog Circuit Testing
- Mechanics of Materials top 10%
- Thermography and Photoacoustic Techniques
Papers in
-
- VLSI and Analog Circuit Testing 7
-
- VLSI and FPGA Design Techniques 5
- Advanced MEMS and NEMS Technologies 2
- Advanced Electrical Measurement Techniques 2
- CCD and CMOS Imaging Sensors 2
- Co-authors
- Gordon Walter Roberts (10 shared papers)Glenn H. Chapman (6 shared papers)Xavier Maldague (3 shared papers)Francois Robitaille (1 shared paper)В. П. Вавилов (1 shared paper)John Petruzzello (2 shared papers)Ted Letavic (2 shared papers)Vladimir Platonovič Vavilov (1 shared paper)
- Journals
- IEEE Communications Magazine (1 paper)Computer Standards & Interfaces (1 paper)NDT & E International (1 paper)IEEE Journal of Solid-State Circuits (1 paper)IEEE Transactions on Instrumentation and Measurement (1 paper)
- Partner nations
- CanadaRussiaNetherlands
In The Last Decade
Benoit Dufort
23 papers receiving 277 citations
Peers
Comparison fields: 5 of 19
- Hardware and Architecture 158
- Mechanics of Materials 57
- Biomedical Engineering 75
- Electrical and Electronic Engineering 78
- Signal Processing 7
Countries citing papers authored by Benoit Dufort
This map shows the geographic impact of Benoit Dufort's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Benoit Dufort with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Benoit Dufort more than expected).
Fields of papers citing papers by Benoit Dufort
This network shows the impact of papers produced by Benoit Dufort. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Benoit Dufort. The network helps show where Benoit Dufort may publish in the future.
Co-authors
The 13 scholars most cited alongside Benoit Dufort, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 23 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 1999 | 109 | |
| 2 | 1993 | 48 | |
| 3 | 2002 | 30 | |
| 4 | 2002 | 13 | |
| 5 | 2000 | 12 | |
| 6 | 2000 | 11 | |
| 7 | 1998 | 10 | |
| 8 | 1993 | 9 | |
| 9 | 1999 | 8 | |
| 10 | 2003 | 8 | |
| 11 | 1994 | 7 | |
| 12 | 1994 | 6 | |
| 13 | 2002 | 6 | |
| 14 | 2002 | 6 | |
| 15 | 1995 | 5 | |
| 16 | 2002 | 5 | |
| 17 | 2002 | 4 | |
| 18 | 1997 | 3 | |
| 19 | 1999 | 3 | |
| 20 | 2004 | 2 |
About Benoit Dufort
Benoit Dufort is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering, Computer Networks and Communications, Biomedical Engineering and Mechanics of Materials, having authored 23 papers that have together received 308 indexed citations. Recurring topics across this work include Analog and Mixed-Signal Circuit Design (7 papers), VLSI and Analog Circuit Testing (7 papers), VLSI and FPGA Design Techniques (5 papers), Interconnection Networks and Systems (5 papers), Thermography and Photoacoustic Techniques (3 papers), Advanced MEMS and NEMS Technologies (2 papers), Advanced Electrical Measurement Techniques (2 papers) and CCD and CMOS Imaging Sensors (2 papers). The work is most often cited by research in Hardware and Architecture (158 citations), Mechanics of Materials (57 citations), Biomedical Engineering (75 citations), Electrical and Electronic Engineering (78 citations) and Signal Processing (7 citations). Benoit Dufort has collaborated with scholars based in Canada, Russia and Netherlands. Frequent co-authors include Gordon Walter Roberts, Glenn H. Chapman, Xavier Maldague, Francois Robitaille, В. П. Вавилов, John Petruzzello, Ted Letavic, Vladimir Platonovič Vavilov, Marek J. Syrzycki and M. Simpson. Their work appears in journals such as IEEE Communications Magazine, Computer Standards & Interfaces, NDT & E International, IEEE Journal of Solid-State Circuits and IEEE Transactions on Instrumentation and Measurement.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.