Bassem Hamieh
Impact in
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- Electron and X-Ray Spectroscopy Techniques
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- Advancements in Photolithography Techniques
- Integrated Circuits and Semiconductor Failure Analysis
- Semiconductor materials and devices
- Silicon and Solar Cell Technologies
Papers in
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- Advancements in Photolithography Techniques 6
- Integrated Circuits and Semiconductor Failure Analysis 3
- 3D IC and TSV technologies 1
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- Electron and X-Ray Spectroscopy Techniques 2
- Optical Coatings and Gratings 2
- Co-authors
- Lei Sun (2 shared papers)Nelson Felix (4 shared papers)Nicole Saulnier (2 shared papers)John Arnold (4 shared papers)Wenhui Wang (1 shared paper)Yann Mignot (2 shared papers)Matthew Colburn (1 shared paper)Yongan Xu (1 shared paper)
- Journals
- Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE (7 papers)
- Partner nations
- United StatesBelgium
In The Last Decade
Bassem Hamieh
6 papers receiving 30 citations
Peers
Comparison fields: 5 of 10
- Surfaces, Coatings and Films 16
- Electrical and Electronic Engineering 30
- Biomedical Engineering 10
- Computational Mechanics 3
- Radiation 1
Countries citing papers authored by Bassem Hamieh
This map shows the geographic impact of Bassem Hamieh's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Bassem Hamieh with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Bassem Hamieh more than expected).
Fields of papers citing papers by Bassem Hamieh
This network shows the impact of papers produced by Bassem Hamieh. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Bassem Hamieh. The network helps show where Bassem Hamieh may publish in the future.
Co-authors
The 25 scholars most cited alongside Bassem Hamieh, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2015 | 15 | |
| 2 | 2017 | 7 | |
| 3 | 2015 | 6 | |
| 4 | 2015 | 2 | |
| 5 | 2016 | 1 | |
| 6 | 2013 | 1 | |
| 7 | 2024 | 0 | |
| 8 | 2017 | 0 |
About Bassem Hamieh
Bassem Hamieh is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films, Biomedical Engineering, Molecular Biology and Computational Mechanics, having authored 8 papers that have together received 32 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (6 papers), Advanced Surface Polishing Techniques (3 papers), Integrated Circuits and Semiconductor Failure Analysis (3 papers), Electron and X-Ray Spectroscopy Techniques (2 papers), Optical Coatings and Gratings (2 papers), Modular Robots and Swarm Intelligence (1 paper), Copper Interconnects and Reliability (1 paper) and 3D IC and TSV technologies (1 paper). The work is most often cited by research in Surfaces, Coatings and Films (16 citations), Electrical and Electronic Engineering (30 citations), Biomedical Engineering (10 citations), Computational Mechanics (3 citations) and Radiation (1 citation). Bassem Hamieh has collaborated with scholars based in United States and Belgium. Frequent co-authors include Lei Sun, Nelson Felix, Nicole Saulnier, John Arnold, Wenhui Wang, Yann Mignot, Matthew Colburn, Yongan Xu, Catherine B. Labelle and Luciana Meli. Their work appears in journals such as Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.