Alex Dommann
Impact in
- Ceramics and Composites top 5%
- Orthodontics top 5%
Papers in
-
- Semiconductor materials and devices 30
- Silicon and Solar Cell Technologies 16
- Thin-Film Transistor Technologies 14
- Advanced MEMS and NEMS Technologies 12
-
- Advanced Surface Polishing Techniques 16
- Co-authors
- A. Neels (62 shared papers)Simone Dolabella (6 shared papers)Aurelio Borzì (5 shared papers)H. von Känel (19 shared papers)J. Ramm (17 shared papers)C. Rosenblad (8 shared papers)E. Müller (11 shared papers)Toby Meyer (1 shared paper)
- Journals
- Surface and Coatings Technology (9 papers)Thin Solid Films (8 papers)Journal of Applied Physics (5 papers)Microelectronic Engineering (3 papers)physica status solidi (a) (3 papers)
- Partner nations
- SwitzerlandUnited StatesGermany
In The Last Decade
Alex Dommann
126 papers receiving 2.1k citations
Alex Dommann's Hit Papers
Peers
Comparison fields: 5 of 110
- Ceramics and Composites 142
- Orthodontics 75
- Electrical and Electronic Engineering 1.0k
- Materials Chemistry 776
- Atomic and Molecular Physics, and Optics 455
Countries citing papers authored by Alex Dommann
This map shows the geographic impact of Alex Dommann's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Alex Dommann with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Alex Dommann more than expected).
Fields of papers citing papers by Alex Dommann
This network shows the impact of papers produced by Alex Dommann. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Alex Dommann. The network helps show where Alex Dommann may publish in the future.
Co-authors
The 25 scholars most cited alongside Alex Dommann, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 131 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | Lattice Strain and Defects Analysis in Nanostructured Semiconductor Materials and Devices by High‐Resolution X‐Ray Diffraction: Theoretical and Practical Aspects Hit paper breakdown → | 2021 | 236 |
| 2 | 2006 | 142 | |
| 3 | 1998 | 124 | |
| 4 | 1994 | 86 | |
| 5 | 1995 | 75 | |
| 6 | 2014 | 68 | |
| 7 | 2000 | 62 | |
| 8 | 2002 | 57 | |
| 9 | 2020 | 54 | |
| 10 | 2007 | 53 | |
| 11 | 2002 | 51 | |
| 12 | 2011 | 50 | |
| 13 | 2012 | 46 | |
| 14 | 2010 | 45 | |
| 15 | 2019 | 41 | |
| 16 | 2013 | 40 | |
| 17 | 2009 | 34 | |
| 18 | 2013 | 31 | |
| 19 | 1992 | 31 | |
| 20 | 2019 | 30 |
About Alex Dommann
Alex Dommann is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering, Materials Chemistry, Atomic and Molecular Physics, and Optics and Mechanics of Materials, having authored 131 papers that have together received 2.2k indexed citations. Recurring topics across this work include Semiconductor materials and devices (30 papers), Metal and Thin Film Mechanics (19 papers), Advanced Surface Polishing Techniques (16 papers), Silicon and Solar Cell Technologies (16 papers), Thin-Film Transistor Technologies (14 papers), Semiconductor Quantum Structures and Devices (12 papers), Advanced MEMS and NEMS Technologies (12 papers) and Force Microscopy Techniques and Applications (9 papers). The work is most often cited by research in Ceramics and Composites (142 citations), Orthodontics (75 citations), Electrical and Electronic Engineering (1.0k citations), Materials Chemistry (776 citations) and Atomic and Molecular Physics, and Optics (455 citations). Alex Dommann has collaborated with scholars based in Switzerland, United States and Germany. Frequent co-authors include A. Neels, Simone Dolabella, Aurelio Borzì, H. von Känel, J. Ramm, C. Rosenblad, E. Müller, Toby Meyer, M. Döbeli and Martin Kummer. Their work appears in journals such as Surface and Coatings Technology, Thin Solid Films, Journal of Applied Physics, Microelectronic Engineering and physica status solidi (a).
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.