Alex Dommann

2.6k citations
128 papers · 2.0k · 1 hit paper · h-index 24

Impact in

Papers in

Alex Dommann

125 papers receiving 2.0k citations

Alex Dommann's Hit Papers

Lattice Strain and Defects Analysis in Nanostructured Semiconductor Materials and Devices by High‐Resolution X‐Ray Diffraction: Theoretical and Practical Aspects 2021 · 210 citations
2100+1+3Years since publication50100150200

Peers

Alex Dommann
Comparison fields: 5 of 111
  • Ceramics and Composites 146
  • Electrical and Electronic Engineering 1.0k
  • Materials Chemistry 739
  • Orthodontics 70
  • Atomic and Molecular Physics, and Optics 434
Replace Hejie Yang with:
Hejie Yang China
W. W. Gerberich United States
F. Soldera Germany
Fredric Ericson Sweden
Praveen Kumar India
Xavier Maeder Switzerland
Finn Giuliani United Kingdom
Yan Yang China
Tsung‐Shune Chin Taiwan
H. Wendrock Germany
Alex Dommann relative to Hejie Yang China Hejie Yang's profile →
Citations per field
00.5×3.7×
Hejie Yang · 1×
Citations per year

Countries citing papers authored by Alex Dommann

Since Specialization
Citations

This map shows the geographic impact of Alex Dommann's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Alex Dommann with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Alex Dommann more than expected).

Fields of papers citing papers by Alex Dommann

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Alex Dommann. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Alex Dommann. The network helps show where Alex Dommann may publish in the future.

Co-authors

The 25 scholars most cited alongside Alex Dommann, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Alex Dommann Line = papers co-authored together Alex Dommann links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 128 papers — load more, or switch the sort, to bring in the rest.

#Work
1
Lattice Strain and Defects Analysis in Nanostructured Semiconductor Materials and Devices by High‐Resolution X‐Ray Diffraction: Theoretical and Practical Aspects
Hit paper breakdown →
2021210
2 2006128
3 1998119
4 199480
5 199573
6 201461
7 200060
8 200256
9 200754
10 201149
11 200249
12 202047
13 201045
14 201244
15 201941
16 201339
17 200935
18 201331
19 199229
20 201928

About Alex Dommann

Alex Dommann is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering, Materials Chemistry, Atomic and Molecular Physics, and Optics and Mechanics of Materials, having authored 128 papers that have together received 2.0k indexed citations. Recurring topics across this work include Semiconductor materials and devices (29 papers), Metal and Thin Film Mechanics (18 papers), Advanced Surface Polishing Techniques (16 papers), Silicon and Solar Cell Technologies (16 papers), Thin-Film Transistor Technologies (14 papers), Semiconductor Quantum Structures and Devices (12 papers), Advanced MEMS and NEMS Technologies (12 papers) and Force Microscopy Techniques and Applications (9 papers). The work is most often cited by research in Ceramics and Composites (146 citations), Electrical and Electronic Engineering (1.0k citations), Materials Chemistry (739 citations), Orthodontics (70 citations) and Atomic and Molecular Physics, and Optics (434 citations). Alex Dommann has collaborated with scholars based in Switzerland, United States and Liechtenstein. Frequent co-authors include A. Neels, Aurelio Borzì, H. von Känel, J. Ramm, C. Rosenblad, E. Müller, M. Döbeli, Toby Meyer, Martin Kummer and R. Kaufmann. Their work appears in journals such as Surface and Coatings Technology, Thin Solid Films, Journal of Applied Physics, Advanced Engineering Materials and Microelectronic Engineering.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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