Wayne Needham
Impact in
- Hardware and Architecture top 2%
- VLSI and Analog Circuit Testing
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- Integrated Circuits and Semiconductor Failure Analysis
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Radiation Effects in Electronics
- Low-power high-performance VLSI design
- Electrostatic Discharge in Electronics
- VLSI and FPGA Design Techniques
Papers in
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- VLSI and Analog Circuit Testing 7
- Physical Unclonable Functions (PUFs) and Hardware Security 1
- Parallel Computing and Optimization Techniques 1
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- Integrated Circuits and Semiconductor Failure Analysis 5
- Advancements in Photolithography Techniques 2
- Electrostatic Discharge in Electronics 1
- Co-authors
- Eng‐Kiong Yeoh (1 shared paper)Alexander Peter Maxwell (3 shared papers)Kenneth M. Butler (3 shared papers)P. Nigh (2 shared papers)Robert C. Aitken (2 shared papers)Wojciech P. Maly (1 shared paper)P.C. Maxwell (1 shared paper)Shianling Wu (1 shared paper)
- Journals
- Computer (1 paper)IEEE Design & Test of Computers (2 papers)The electrical engineering handbook/Electrical engineering handbook series/Electrical engineering handbook (1 paper)Medical Entomology and Zoology (1 paper)
- Partner nations
- United StatesUnited KingdomTaiwan
In The Last Decade
Wayne Needham
9 papers receiving 347 citations
Peers
Comparison fields: 5 of 17
- Hardware and Architecture 322
- Electrical and Electronic Engineering 355
- Software 10
- Control and Systems Engineering 28
- Industrial and Manufacturing Engineering 8
Countries citing papers authored by Wayne Needham
This map shows the geographic impact of Wayne Needham's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Wayne Needham with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Wayne Needham more than expected).
Fields of papers citing papers by Wayne Needham
This network shows the impact of papers produced by Wayne Needham. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Wayne Needham. The network helps show where Wayne Needham may publish in the future.
Co-authors
The 9 scholars most cited alongside Wayne Needham, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2002 | 154 | |
| 2 | 2002 | 105 | |
| 3 | 2002 | 68 | |
| 4 | 2002 | 14 | |
| 5 | 1999 | 9 | |
| 6 | Best Methods for At-Speed Testing? | 1998 | 8 |
| 7 | Designer's Guide to Testable Asic Devices | 1991 | 7 |
| 8 | 1998 | 4 | |
| 9 | 1997 | 1 | |
| 10 | 1998 | 1 |
About Wayne Needham
Wayne Needham is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering, Industrial and Manufacturing Engineering, Control and Systems Engineering and Insect Science, having authored 10 papers that have together received 371 indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (7 papers), Integrated Circuits and Semiconductor Failure Analysis (5 papers), Advancements in Photolithography Techniques (2 papers), Electrostatic Discharge in Electronics (1 paper), Industrial Vision Systems and Defect Detection (1 paper), Physical Unclonable Functions (PUFs) and Hardware Security (1 paper), Real-time simulation and control systems (1 paper) and Parallel Computing and Optimization Techniques (1 paper). The work is most often cited by research in Hardware and Architecture (322 citations), Electrical and Electronic Engineering (355 citations), Software (10 citations), Control and Systems Engineering (28 citations) and Industrial and Manufacturing Engineering (8 citations). Wayne Needham has collaborated with scholars based in United States, United Kingdom and Taiwan. Frequent co-authors include Eng‐Kiong Yeoh, Alexander Peter Maxwell, Kenneth M. Butler, P. Nigh, Robert C. Aitken, Wojciech P. Maly, P.C. Maxwell, Shianling Wu and Harold R. Parks. Their work appears in journals such as Computer, IEEE Design & Test of Computers, The electrical engineering handbook/Electrical engineering handbook series/Electrical engineering handbook and Medical Entomology and Zoology.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.