W. Bartels
Impact in
-
- Semiconductor Quantum Structures and Devices
- Semiconductor materials and interfaces
- Surfaces, Coatings and Films top 5%
Papers in
-
- Semiconductor materials and interfaces 6
- Semiconductor Quantum Structures and Devices 4
-
- Advanced Semiconductor Detectors and Materials 3
- Semiconductor materials and devices 3
- Silicon and Solar Cell Technologies 3
- Co-authors
- J. Hornstra (2 shared papers)W. Nijman (3 shared papers)P.J. Roksnoer (2 shared papers)J. Farges (2 shared papers)M. Duseaux (1 shared paper)J. Hallais (1 shared paper)Guy Jacob (1 shared paper)C. Werkhoven (1 shared paper)
- Journals
- Journal of Crystal Growth (8 papers)Materials Research Bulletin (1 paper)Optical Engineering (1 paper)Journal of Applied Physics (1 paper)Journal of Electronic Materials (1 paper)
- Partner nations
- NetherlandsFinlandUnited States
In The Last Decade
W. Bartels
17 papers receiving 1.1k citations
W. Bartels's Hit Papers
Peers
Comparison fields: 5 of 50
- Atomic and Molecular Physics, and Optics 786
- Surfaces, Coatings and Films 111
- Condensed Matter Physics 168
- Electrical and Electronic Engineering 744
- Radiation 90
Countries citing papers authored by W. Bartels
This map shows the geographic impact of W. Bartels's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by W. Bartels with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites W. Bartels more than expected).
Fields of papers citing papers by W. Bartels
This network shows the impact of papers produced by W. Bartels. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by W. Bartels. The network helps show where W. Bartels may publish in the future.
Co-authors
The 22 scholars most cited alongside W. Bartels, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | Determination of the lattice constant of epitaxial layers of III-V compounds Hit paper breakdown → | 1978 | 419 |
| 2 | 1986 | 243 | |
| 3 | 1983 | 236 | |
| 4 | 1978 | 189 | |
| 5 | 1982 | 34 | |
| 6 | 1977 | 28 | |
| 7 | 1976 | 23 | |
| 8 | 1987 | 21 | |
| 9 | 1985 | 8 | |
| 10 | 1977 | 8 | |
| 11 | 1976 | 7 | |
| 12 | 1985 | 7 | |
| 13 | 1971 | 5 | |
| 14 | 1987 | 5 | |
| 15 | 1975 | 3 | |
| 16 | 1980 | 2 | |
| 17 | High-resolution X-ray diffractometer | 1983 | 1 |
| 18 | 1980 | 0 | |
| 19 | 1983 | 0 |
About W. Bartels
W. Bartels is a scholar working on Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering, Materials Chemistry, Surfaces, Coatings and Films and Mechanics of Materials, having authored 19 papers that have together received 1.2k indexed citations. Recurring topics across this work include Semiconductor materials and interfaces (6 papers), Semiconductor Quantum Structures and Devices (4 papers), Advanced Semiconductor Detectors and Materials (3 papers), Electron and X-Ray Spectroscopy Techniques (3 papers), Semiconductor materials and devices (3 papers), Silicon and Solar Cell Technologies (3 papers), Advanced Materials and Mechanics (3 papers) and X-ray Diffraction in Crystallography (2 papers). The work is most often cited by research in Atomic and Molecular Physics, and Optics (786 citations), Surfaces, Coatings and Films (111 citations), Condensed Matter Physics (168 citations), Electrical and Electronic Engineering (744 citations) and Radiation (90 citations). W. Bartels has collaborated with scholars based in Netherlands, Finland and United States. Frequent co-authors include J. Hornstra, W. Nijman, P.J. Roksnoer, J. Farges, M. Duseaux, J. Hallais, Guy Jacob, C. Werkhoven, J. Verhoeven and M.J. van der Wiel. Their work appears in journals such as Journal of Crystal Growth, Materials Research Bulletin, Optical Engineering, Journal of Applied Physics and Journal of Electronic Materials.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.