Vu Le
Impact in
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- Risk and Safety Analysis
- Medical Laboratory Technology top 10%
Papers in
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- Simulation Techniques and Applications 8
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- Electrical Fault Detection and Protection 9
- Integrated Circuits and Semiconductor Failure Analysis 5
- Electrostatic Discharge in Electronics 4
- Co-authors
- Xiu Yao (9 shared papers)Chad Miller (4 shared papers)Bang‐Hung Tsao (2 shared papers)Doug Creighton (12 shared papers)Saeid Nahavandi (9 shared papers)Michael Johnstone (13 shared papers)Christy Chuang‐Stein (1 shared paper)William Chen (1 shared paper)
- Journals
- IEEE Transactions on Power Electronics (2 papers)Soft Computing (2 papers)Expert Systems with Applications (2 papers)Economics Letters (1 paper)IEEE Journal of Emerging and Selected Topics in Power Electronics (1 paper)
- Partner nations
- AustraliaUnited StatesJapan
In The Last Decade
Vu Le
35 papers receiving 334 citations
Peers
Comparison fields: 5 of 67
- Statistics, Probability and Uncertainty 92
- Medical Laboratory Technology 16
- Radiological and Ultrasound Technology 43
- Control and Systems Engineering 102
- Industrial and Manufacturing Engineering 36
Countries citing papers authored by Vu Le
This map shows the geographic impact of Vu Le's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Vu Le with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Vu Le more than expected).
Fields of papers citing papers by Vu Le
This network shows the impact of papers produced by Vu Le. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Vu Le. The network helps show where Vu Le may publish in the future.
Co-authors
The 25 scholars most cited alongside Vu Le, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 36 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2020 | 115 | |
| 2 | 2021 | 29 | |
| 3 | 2022 | 17 | |
| 4 | 2007 | 16 | |
| 5 | 2001 | 15 | |
| 6 | 2019 | 12 | |
| 7 | 2012 | 10 | |
| 8 | 2018 | 10 | |
| 9 | 2010 | 10 | |
| 10 | 2019 | 9 | |
| 11 | 2021 | 8 | |
| 12 | Kinect crowd interaction | 2012 | 8 |
| 13 | 2015 | 8 | |
| 14 | 2012 | 8 | |
| 15 | 2005 | 7 | |
| 16 | 2023 | 6 | |
| 17 | 2023 | 5 | |
| 18 | 2021 | 5 | |
| 19 | 2021 | 5 | |
| 20 | 2017 | 4 |
About Vu Le
Vu Le is a scholar working on Management Science and Operations Research, Electrical and Electronic Engineering, Industrial and Manufacturing Engineering, Statistics, Probability and Uncertainty and Computer Networks and Communications, having authored 36 papers that have together received 342 indexed citations. Recurring topics across this work include Electrical Fault Detection and Protection (9 papers), Simulation Techniques and Applications (8 papers), Advanced Manufacturing and Logistics Optimization (7 papers), Scheduling and Optimization Algorithms (6 papers), Integrated Circuits and Semiconductor Failure Analysis (5 papers), Risk and Safety Analysis (4 papers), Electrostatic Discharge in Electronics (4 papers) and Metaheuristic Optimization Algorithms Research (3 papers). The work is most often cited by research in Statistics, Probability and Uncertainty (92 citations), Medical Laboratory Technology (16 citations), Radiological and Ultrasound Technology (43 citations), Control and Systems Engineering (102 citations) and Industrial and Manufacturing Engineering (36 citations). Vu Le has collaborated with scholars based in Australia, United States and Japan. Frequent co-authors include Xiu Yao, Chad Miller, Bang‐Hung Tsao, Doug Creighton, Saeid Nahavandi, Michael Johnstone, Christy Chuang‐Stein, William Chen, Saeid Nahavandi and James Zhang. Their work appears in journals such as IEEE Transactions on Power Electronics, Soft Computing, Expert Systems with Applications, Economics Letters and IEEE Journal of Emerging and Selected Topics in Power Electronics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.