Tomokazu Yoneda
About
Tomokazu Yoneda has authored 20 papers that have received a total of 79 indexed citations.
This includes 19 papers in Electrical and Electronic Engineering, 19 papers in Hardware and Architecture and 3 papers in Computer Networks and Communications. The topics of these papers are VLSI and Analog Circuit Testing (19 papers), Integrated Circuits and Semiconductor Failure Analysis (14 papers) and VLSI and FPGA Design Techniques (8 papers). Tomokazu Yoneda is often cited by papers focused on VLSI and Analog Circuit Testing (19 papers), Integrated Circuits and Semiconductor Failure Analysis (14 papers) and VLSI and FPGA Design Techniques (8 papers) and collaborates with scholars based in Japan, United States and Malaysia. Tomokazu Yoneda's co-authors include Hideo Fujiwara, Michiko Inoue, Hiroyuki Iwata, Krishnendu Chakrabarty and Tomomi Uchiyama and has published in prestigious journals such as IEICE Transactions on Information and Systems, Integration and Journal of Electronic Testing
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