T.L. McDevitt
Impact in
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- Copper Interconnects and Reliability
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- solar cell performance optimization
- Electrodeposition and Electroless Coatings
- Low-power high-performance VLSI design
- Semiconductor materials and devices
Papers in
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- Copper Interconnects and Reliability 6
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- Metallurgical and Alloy Processes 1
- Co-authors
- David E. Laughlin (2 shared papers)V. G. Keramidas (2 shared papers)Subhash K Mahajan (2 shared papers)S. E. Luce (4 shared papers)John E. Heidenreich (3 shared papers)Reinhard Schulz (1 shared paper)William Cote (2 shared papers)L.T. Su (1 shared paper)
- Journals
- ECS Transactions (1 paper)Physical review. B, Condensed matter (1 paper)International Symposium on the Physical and Failure Analysis of Integrated Circuits (2 papers)2022 IEEE 72nd Electronic Components and Technology Conference (ECTC) (1 paper)Technical digest - International Electron Devices Meeting/Technical digest (1 paper)
- Partner nations
- United States
In The Last Decade
T.L. McDevitt
11 papers receiving 356 citations
Peers
Comparison fields: 5 of 23
- Electronic, Optical and Magnetic Materials 179
- Electrical and Electronic Engineering 164
- Hardware and Architecture 21
- Atomic and Molecular Physics, and Optics 69
- General Materials Science 5
Countries citing papers authored by T.L. McDevitt
This map shows the geographic impact of T.L. McDevitt's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by T.L. McDevitt with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites T.L. McDevitt more than expected).
Fields of papers citing papers by T.L. McDevitt
This network shows the impact of papers produced by T.L. McDevitt. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by T.L. McDevitt. The network helps show where T.L. McDevitt may publish in the future.
Co-authors
The 25 scholars most cited alongside T.L. McDevitt, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2002 | 240 | |
| 2 | 1992 | 80 | |
| 3 | 2002 | 35 | |
| 4 | 2003 | 9 | |
| 5 | 2008 | 9 | |
| 6 | 2002 | 6 | |
| 7 | 1986 | 4 | |
| 8 | 1990 | 4 | |
| 9 | 2007 | 4 | |
| 10 | 2013 | 3 | |
| 11 | 2003 | 2 |
About T.L. McDevitt
T.L. McDevitt is a scholar working on Electronic, Optical and Magnetic Materials, General Materials Science, Industrial and Manufacturing Engineering, Atomic and Molecular Physics, and Optics and Electrical and Electronic Engineering, having authored 11 papers that have together received 396 indexed citations. Recurring topics across this work include Copper Interconnects and Reliability (6 papers), Solidification and crystal growth phenomena (2 papers), Semiconductor materials and interfaces (2 papers), Semiconductor Quantum Structures and Devices (1 paper), Metallurgical and Alloy Processes (1 paper), VLSI and FPGA Design Techniques (1 paper), Semiconductor materials and devices (1 paper) and Advancements in Photolithography Techniques (1 paper). The work is most often cited by research in Electronic, Optical and Magnetic Materials (179 citations), Electrical and Electronic Engineering (164 citations), Hardware and Architecture (21 citations), Atomic and Molecular Physics, and Optics (69 citations) and General Materials Science (5 citations). T.L. McDevitt has collaborated with scholars based in United States. Frequent co-authors include David E. Laughlin, V. G. Keramidas, Subhash K Mahajan, S. E. Luce, John E. Heidenreich, Reinhard Schulz, William Cote, L.T. Su, Naftali Lustig and P. Roper. Their work appears in journals such as ECS Transactions, Physical review. B, Condensed matter, International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC) and Technical digest - International Electron Devices Meeting/Technical digest.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.