Thomas Neyer
Impact in
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- Ga2O3 and related materials
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- Silicon Carbide Semiconductor Technologies
- Radiation Effects in Electronics
- Semiconductor materials and devices
- Advanced DC-DC Converters
Papers in
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- Silicon Carbide Semiconductor Technologies 16
- Integrated Circuits and Semiconductor Failure Analysis 1
- Radiation Effects in Electronics 1
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- Industrial Vision Systems and Defect Detection 1
- Co-authors
- Andrey O. Konstantinov (9 shared papers)Fredrik Allerstam (11 shared papers)Martin Domeij (8 shared papers)Mehrdad Baghaie Yazdi (4 shared papers)James D. Plummer (1 shared paper)Juan Rivas-Davila (1 shared paper)J. Roig (1 shared paper)James Victory (3 shared papers)
- Journals
- APL Materials (1 paper)Journal of Electron Spectroscopy and Related Phenomena (1 paper)IEEE Journal of Emerging and Selected Topics in Power Electronics (1 paper)Microelectronics Reliability (1 paper)Journal of Microscopy (1 paper)
- Partner nations
- United StatesAustriaBelgium
In The Last Decade
Thomas Neyer
21 papers receiving 557 citations
Thomas Neyer's Hit Papers
Peers
Comparison fields: 5 of 18
- Electronic, Optical and Magnetic Materials 403
- Electrical and Electronic Engineering 160
- Condensed Matter Physics 25
- Structural Biology 2
- Surfaces, Coatings and Films 5
Countries citing papers authored by Thomas Neyer
This map shows the geographic impact of Thomas Neyer's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Thomas Neyer with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Thomas Neyer more than expected).
Fields of papers citing papers by Thomas Neyer
This network shows the impact of papers produced by Thomas Neyer. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Thomas Neyer. The network helps show where Thomas Neyer may publish in the future.
Co-authors
The 23 scholars most cited alongside Thomas Neyer, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 21 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | β-Gallium oxide power electronics Hit paper breakdown → | 2022 | 447 |
| 2 | 2020 | 19 | |
| 3 | 2017 | 15 | |
| 4 | 2021 | 13 | |
| 5 | 2016 | 12 | |
| 6 | 2018 | 9 | |
| 7 | 1997 | 7 | |
| 8 | 2014 | 7 | |
| 9 | Silicon Carbide Schottky-Barrier Diode Rectifiers with High Avalanche Robustness | 2015 | 7 |
| 10 | 2015 | 6 | |
| 11 | A Physically Based Scalable SPICE Model for High-Voltage Super-Junction MOSFETs | 2014 | 5 |
| 12 | 2016 | 5 | |
| 13 | 2017 | 5 | |
| 14 | 2018 | 5 | |
| 15 | 2022 | 5 | |
| 16 | 2020 | 4 | |
| 17 | 2014 | 3 | |
| 18 | 1995 | 2 | |
| 19 | H³TRB Test on 1.2 kV SiC MOSFETs | 2018 | 2 |
| 20 | 2004 | 1 |
About Thomas Neyer
Thomas Neyer is a scholar working on Electrical and Electronic Engineering, Industrial and Manufacturing Engineering, Biomedical Engineering, Electronic, Optical and Magnetic Materials and Control and Systems Engineering, having authored 21 papers that have together received 580 indexed citations. Recurring topics across this work include Silicon Carbide Semiconductor Technologies (16 papers), Plasmonic and Surface Plasmon Research (2 papers), Industrial Vision Systems and Defect Detection (1 paper), Integrated Circuits and Semiconductor Failure Analysis (1 paper), Fault Detection and Control Systems (1 paper), Radiation Effects in Electronics (1 paper) and Ga2O3 and related materials (1 paper). The work is most often cited by research in Electronic, Optical and Magnetic Materials (403 citations), Electrical and Electronic Engineering (160 citations), Condensed Matter Physics (25 citations), Structural Biology (2 citations) and Surfaces, Coatings and Films (5 citations). Thomas Neyer has collaborated with scholars based in United States, Austria and Belgium. Frequent co-authors include Andrey O. Konstantinov, Fredrik Allerstam, Martin Domeij, Mehrdad Baghaie Yazdi, James D. Plummer, Juan Rivas-Davila, J. Roig, James Victory, Xu Dong Wu and Kwangwon Lee. Their work appears in journals such as APL Materials, Journal of Electron Spectroscopy and Related Phenomena, IEEE Journal of Emerging and Selected Topics in Power Electronics, Microelectronics Reliability and Journal of Microscopy.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.