Thomas M. Moore

1.8k citations
43 papers · 1.3k · 1 hit paper · h-index 14

Impact in

Papers in

Thomas M. Moore

39 papers receiving 1.2k citations

Thomas M. Moore's Hit Papers

Observation of discrete electronic states in a zero-dimensional semiconductor nanostructure 1988 · 749 citations
7490+12+25Years since publication200400600

Peers

Thomas M. Moore
Comparison fields: 5 of 80
  • Structural Biology 45
  • Atomic and Molecular Physics, and Optics 673
  • Electrical and Electronic Engineering 563
  • Surfaces, Coatings and Films 53
  • Condensed Matter Physics 85
Replace Yanan Dai with:
Yanan Dai China
L. J. Clarke United Kingdom
Roger Carr United States
Martin Švec Czechia
Pascal Pochet France
Primož Rebernik Ribič Slovenia
K. Cho United States
Yusuke Sakai Japan
Hiromichi Horinaka Japan
Andreas Thon Germany
Thomas M. Moore relative to Yanan Dai China Yanan Dai's profile →
Citations per field
00.5×2.6×
Yanan Dai · 1×
Citations per year

Countries citing papers authored by Thomas M. Moore

Since Specialization
Citations

This map shows the geographic impact of Thomas M. Moore's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Thomas M. Moore with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Thomas M. Moore more than expected).

Fields of papers citing papers by Thomas M. Moore

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Thomas M. Moore. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Thomas M. Moore. The network helps show where Thomas M. Moore may publish in the future.

Co-authors

The 25 scholars most cited alongside Thomas M. Moore, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Thomas M. Moore Line = papers co-authored together Thomas M. Moore links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 43 papers — load more, or switch the sort, to bring in the rest.

#Work
1
Observation of discrete electronic states in a zero-dimensional semiconductor nanostructure
Hit paper breakdown →
1988749
2 200898
3 199935
4 201631
5 199228
6 198728
7 201822
8 198822
9 201921
10 201220
11 201620
12 198320
13 201720
14 198814
15 200112
16 199212
17 199211
18 200210
19 20058
20 20027

About Thomas M. Moore

Thomas M. Moore is a scholar working on Electrical and Electronic Engineering, Materials Chemistry, Structural Biology, Surfaces, Coatings and Films and Atomic and Molecular Physics, and Optics, having authored 43 papers that have together received 1.3k indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (11 papers), Advanced Electron Microscopy Techniques and Applications (8 papers), Electron and X-Ray Spectroscopy Techniques (8 papers), Semiconductor materials and devices (7 papers), Semiconductor Quantum Structures and Devices (5 papers), Non-Destructive Testing Techniques (5 papers), Ultrasonics and Acoustic Wave Propagation (5 papers) and Industrial Vision Systems and Defect Detection (3 papers). The work is most often cited by research in Structural Biology (45 citations), Atomic and Molecular Physics, and Optics (673 citations), Electrical and Electronic Engineering (563 citations), Surfaces, Coatings and Films (53 citations) and Condensed Matter Physics (85 citations). Thomas M. Moore has collaborated with scholars based in United States. Frequent co-authors include R. J. Matyi, John N. Randall, Mark A. Reed, Rahul Aggarwal, A. E. Wetsel, Guangyao Gao, Joshua V. Ruppel, Jess E. Jones, X. Peter Zhang and A. E. Taylor. Their work appears in journals such as Microscopy and Microanalysis, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, Advanced Materials Technologies, Dalton Transactions and Applied Physics Letters.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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