T. Ohno

26 papers receiving 572 citations

Peers

T. Ohno
Comparison fields: 5 of 27
  • Electronic, Optical and Magnetic Materials 163
  • Atomic and Molecular Physics, and Optics 203
  • Mechanics of Materials 145
  • Ocean Engineering 90
  • Electrical and Electronic Engineering 321
Replace Scott Roberts with:
Scott Roberts United States
K. L. Telschow United States
M. Sawamura Japan
A. Yu. Belov Germany
R. H. Bogaard United States
E. Chilla Germany
Shangsheng Li China
Y. Fan United Kingdom
Han Cheng China
M. Hashimoto Japan
T. Ohno relative to Scott Roberts United States Scott Roberts's profile →
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Countries citing papers authored by T. Ohno

Since Specialization
Citations

This map shows the geographic impact of T. Ohno's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by T. Ohno with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites T. Ohno more than expected).

Fields of papers citing papers by T. Ohno

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by T. Ohno. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by T. Ohno. The network helps show where T. Ohno may publish in the future.

Co-authors

The 25 scholars most cited alongside T. Ohno, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with T. Ohno Line = papers co-authored together T. Ohno links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 26 papers — load more, or switch the sort, to bring in the rest.

#Work
1 2003171
2 200489
3 200243
4 200238
5 199338
6 198733
7 198827
8 200224
9 199917
10 200416
11 199115
12 200015
13 199214
14 198713
15 19879
16 19898
17 20046
18 19855
19 20004
20 19944

About T. Ohno

T. Ohno is a scholar working on Mechanics of Materials, Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials and Materials Chemistry, having authored 26 papers that have together received 600 indexed citations. Recurring topics across this work include Metal and Thin Film Mechanics (7 papers), Magnetic properties of thin films (6 papers), Silicon Carbide Semiconductor Technologies (4 papers), Physics of Superconductivity and Magnetism (4 papers), Drilling and Well Engineering (3 papers), Semiconductor materials and devices (3 papers), Tunneling and Rock Mechanics (3 papers) and Diamond and Carbon-based Materials Research (3 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (163 citations), Atomic and Molecular Physics, and Optics (203 citations), Mechanics of Materials (145 citations), Ocean Engineering (90 citations) and Electrical and Electronic Engineering (321 citations). T. Ohno has collaborated with scholars based in Japan and United Kingdom. Frequent co-authors include Takaya Suzuki, Kazuo Arai, Kazutoshi Kojima, Hiroshi Yamaguchi, J.C. Rowley, M. KOSUGI, Hirokazu Karasawa, Y. Shiroishi, Hirokazu Suzuki and Y. Matsuda. Their work appears in journals such as IEEE Transactions on Magnetics, Journal of Energy Resources Technology, Physica C Superconductivity, Journal of Crystal Growth and Journal of Applied Physics.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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